Inventor · disambiguated record
Roland Ochoa
Also filed as: OCHOA ROLAND
18 granted patents·493 citations·filing 1995–2003
95Inventor score
Top patents by PatentIndex Score
18 records- 0196US5627785AMemory device with a sense amplifierMICRON TECHNOLOGY INC·Filed 1996·Granted May 6, 1997·173 cites·19 claims
- 0288US6347394B1Buffering circuit embedded in an integrated circuit device module used for buffering clocks and other input signalsMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 12, 2002·92 cites·13 claims
- 0383US6289292B1System for identifying a component with physical characterizationMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 11, 2001·61 cites·20 claims
- 0481US6546512B1Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·19 cites·14 claims
- 0571US5864565ASemiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 26, 1999·25 cites·16 claims
- 0670US6161052AMethod for identifying a component with physical characterizationMICRON ELECTRONICS INC·Filed 1997·Granted Dec 12, 2000·34 cites·31 claims
- 0760US5615158ASense amplifier circuit for detecting degradation of digit lines and method thereofMICRON TECHNOLOGY INC·Filed 1995·Granted Mar 25, 1997·17 cites·19 claims
- 0854US5742549ASense amplifier circuit for detecting degradation of digit lines and method thereofMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 21, 1998·12 cites·23 claims
- 0953US6665827B2Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 16, 2003·4 cites·11 claims
- 1050US6054682AMethod and system for reducing water vapor in integrated circuit packages prior to reflowMICRON ELECTRONICS INC·Filed 1999·Granted Apr 25, 2000·11 cites·44 claims
- 1149US6560733B1Soft error detection for digital signal processorsMICRON TECHNOLOGY INC·Filed 1999·Granted May 6, 2003·12 cites·27 claims
- 1249US6314538B1Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 6, 2001·10 cites·24 claims
- 1344US6172924B1Memory device with a sense amplifierMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 9, 2001·3 cites·75 claims
- 1442US5744978AVariable load device responsive to a circuit parameterMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 28, 1998·6 cites·7 claims
- 1537US6058058AMemory device with a sense amplifierMICRON TECHNOLOGY INC·Filed 1998·Granted May 2, 2000·4 cites·17 claims
- 1637US5901099AMemory device with a sense amplifierMICRON TECHNOLOGY INC·Filed 1997·Granted May 4, 1999·4 cites·18 claims
- 1734US5812470AApparatus, system and method for identifying semiconductor memory access modesMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 22, 1998·5 cites·29 claims
- 1830US5940338AMemory device with a sense amplifierMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 17, 1999·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →