Inventor · disambiguated record
Robert E. Parks
Also filed as: PARKS JR ROBERT E · PARKS ROBERT E · PARKS ROBERT EDSON
13 granted patents·2 pending applications·444 citations·filing 1975–2013
93Inventor score
Top patents by PatentIndex Score
15 records- 0194US5955661AOptical profilometer combined with stylus probe measurement deviceKLA TENCOR CORP·Filed 1997·Granted Sep 21, 1999·125 cites·39 claims
- 0285US4018562AChemiluminescent nitrogen detection apparatus and methodANTEK INSTR·Filed 1975·Granted Apr 19, 1977·52 cites·10 claims
- 0381US5897424ARenewable polishing lapUS COMMERCE·Filed 1995·Granted Apr 27, 1999·55 cites·34 claims
- 0477US4352779AChemiluminescent sulfur detection apparatus and methodANTEK INSTR·Filed 1981·Granted Oct 5, 1982·34 cites·6 claims
- 0569US5739906AInterferometric thickness variation test method for windows and silicon wafers using a diverging wavefrontUS ARMY·Filed 1996·Granted Apr 14, 1998·34 cites·21 claims
- 0668US4678756AChemiluminescent sulfur detection apparatus and methodANTEK INSTR·Filed 1982·Granted Jul 7, 1987·23 cites·11 claims
- 0767US6459490B1Dual field of view optical system for microscope, and microscope and interferometer containing the sameOPTICAL PERSPECTIVES GROUP L L·Filed 2000·Granted Oct 1, 2002·12 cites·31 claims
- 0866US5502566AMethod and apparatus for absolute optical measurement of entire surfaces of flatsWYKO CORP·Filed 1995·Granted Mar 26, 1996·35 cites·8 claims
- 0965US4751224ATreatment of metastasisUNIV BROWN RES FOUND·Filed 1986·Granted Jun 14, 1988·36 cites·10 claims
- 1058US6924897B2Point source module and methods of aligning and using the sameFiled 2001·Granted Aug 2, 2005·6 cites·40 claims
- 1157US5050583ADevice for protectively covering hearthsCHAPEK ANTHONY J·Filed 1990·Granted Sep 24, 1991·27 cites·5 claims
- 1254US6870615B2Dual beam spectrophotometer modular sample systemFiled 2003·Granted Mar 22, 2005·5 cites·15 claims
- 1335US2013301056A1Noncontact interferometric sensor and method of usePARKS ROBERT E·Filed 2013·Application pending·0 cites
- 1434US9068904B2System and method for non-contact metrology of surfacesPARKS ROBERT E·Filed 2012·Granted Jun 30, 2015·0 cites·54 claims
- 1533US2006268282A1Adaptive nulls for testing off-axis segments of asphericsEVANS CHRISTOPHER J·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →