Inventor · disambiguated record
Rohit Patnaik
Also filed as: PATNAIK ROHIT
9 granted patents·3 pending applications·127 citations·filing 2000–2016
88Inventor score
Top patents by PatentIndex Score
12 records- 0192US10042079B2Image-based object detection and feature extraction from a reconstructed charged particle image of a volume of interestDECISION SCIENCES INT CORP·Filed 2015·Granted Aug 7, 2018·17 cites·45 claims
- 0291US9985943B1Automated agent detection using multiple factorsAMAZON TECH INC·Filed 2013·Granted May 29, 2018·36 cites·19 claims
- 0390US10438225B1Game-based automated agent detectionAMAZON TECH INC·Filed 2013·Granted Oct 8, 2019·24 cites·22 claims
- 0484US10217190B2System and method for reconstructing high-resolution point spread functions from low-resolution inspection imagesKLA TENCOR CORP·Filed 2016·Granted Feb 26, 2019·7 cites·26 claims
- 0577US10115199B2Image based object locatorDECISION SCIENCES INT CORP·Filed 2015·Granted Oct 30, 2018·3 cites·17 claims
- 0675US7013038B1Method for inspecting a BGA jointTERADYNE INC·Filed 2000·Granted Mar 14, 2006·18 cites·11 claims
- 0774US6996265B1Inspection method utilizing vertical slice imagingTERADYNE INC·Filed 2000·Granted Feb 7, 2006·19 cites·10 claims
- 0858US7925074B2Adaptive background propagation method and device thereforTERADYNE INC·Filed 2007·Granted Apr 12, 2011·2 cites·40 claims
- 0955US7327870B2Method for inspecting a region of interestTERADYNE INC·Filed 2006·Granted Feb 5, 2008·1 cites·14 claims
- 1047US2008298537A1Planar x-ray tomosynthesis devicePATNAIK ROHIT·Filed 2008·Application pending·0 cites
- 1147US2008130983A1Method for inspecting a region of interestTERADYNE INC·Filed 2007·Application pending·0 cites
- 1243US2008247505A1Xray device for planar tomosynthesisPATNAIK ROHIT·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →