Inventor · disambiguated record
Roman Sappey
Also filed as: SAPPEY ROMAN
1 granted patent·1 pending application·6 citations·filing 2010–2024
27Inventor score
Top patents by PatentIndex Score
2 records- 0170US9163987B2Defect inspection and photoluminescence measurement systemSAPPEY ROMAN·Filed 2010·Granted Oct 20, 2015·6 cites·21 claims
- 0259US2025146893A1Transistor channel stress and mobility metrology using multipass spectroscopic ellipsometry and raman joint measurementKLA CORP·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →