Inventor · disambiguated record
Roman A. Slizynski
Also filed as: SLIZYNSKI ROMAN · SLIZYNSKI ROMAN A · SLIZYNSKI ROMAN AURELI
8 granted patents·3 pending applications·99 citations·filing 1996–2015
86Inventor score
Files withSLIZYNSKI ROMAN A4CREDENCE SYSTEMS CORP2JOHANSEN JERALD A2CELLUTIONS INC1CREDENCE SYSTEMS CORPROATION1
Top patents by PatentIndex Score
11 records- 0178US9445742B2Electrical impedance techniques in tissue-mass detection and characterizationSLIZYNSKI ROMAN A·Filed 2015·Granted Sep 20, 2016·4 cites·12 claims
- 0273US6057679AIntegrated circuit tester having amorphous logic for real-time data analysisCREDENCE SYSTEMS CORP·Filed 1998·Granted May 2, 2000·38 cites·18 claims
- 0371US9042976B2Use of impedance techniques in breast-mass detectionSLIZYNSKI ROMAN A·Filed 2011·Granted May 26, 2015·6 cites·9 claims
- 0470US9037227B2Use of impedance techniques in breast-mass detectionSLIZYNSKI ROMAN A·Filed 2010·Granted May 19, 2015·6 cites·17 claims
- 0566US8348938B2Apparatus, systems and methods for treating a human tissue conditionOLD DOMINIAN UNIVERSITY RES FOUNDATION·Filed 2009·Granted Jan 8, 2013·12 cites·10 claims
- 0660US5708432ACoherent sampling digitizer systemCREDENCE SYSTEMS CORP·Filed 1996·Granted Jan 13, 1998·24 cites·12 claims
- 0752US2010069781A1Device and method for accessing and treating ducts of mammary glandsJOHANSEN JERALD A·Filed 2009·Application pending·0 cites
- 0846US2013046171A1Device and method for accessing and treating ducts of mammary glandsJOHANSEN JERALD A·Filed 2012·Application pending·0 cites
- 0940US9386937B2Impedance techniques in tissue-mass detection and characterizationSLIZYNSKI ROMAN A·Filed 2015·Granted Jul 12, 2016·0 cites·12 claims
- 1037US2010298825A1Treatment System With A Pulse Forming Network For Achieving Plasma In TissueCELLUTIONS INC·Filed 2010·Application pending·0 cites
- 1135US6031479AProgrammable digitizer with adjustable sampling rate and triggering modesCREDENCE SYSTEMS CORPROATION·Filed 1998·Granted Feb 29, 2000·9 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →