Inventor · disambiguated record
Robert Weiss
Also filed as: WEISS ROBERT · WEISS ROBERT F
9 granted patents·2 pending applications·31 citations·filing 1985–2023
80Inventor score
Files withBOSCH GMBH ROBERT4WEISS ROBERT F3TRUMPF PHOTONIC COMPONENTS GMBH2SENSOPART IND GMBH1ZEISS CARL SMT GMBH1
Top patents by PatentIndex Score
11 records- 0174US9684251B2Microlithographic projection exposure apparatus and method of correcting optical wavefront deformations in such an apparatusZEISS CARL SMT GMBH·Filed 2016·Granted Jun 20, 2017·2 cites·24 claims
- 0264US12436247B2Laser sensor module with soiling detectionTRUMPF PHOTONIC COMPONENTS GMBH·Filed 2021·Granted Oct 7, 2025·0 cites·15 claims
- 0361US2025258083A1Method for determining a particle distributionTRUMPF PHOTONIC COMPONENTS GMBH·Filed 2023·Application pending·0 cites
- 0459US12055475B2Method of reducing false-positive particle counts of an interference particle sensor moduleBOSCH GMBH ROBERT·Filed 2020·Granted Aug 6, 2024·0 cites·16 claims
- 0559US11543273B2Method and apparatus for determining the absolute value of the flow velocity of a particle-transporting mediumBOSCH GMBH ROBERT·Filed 2019·Granted Jan 3, 2023·0 cites·22 claims
- 0653US10935483B2Optical particle sensor device and method for operating an optical particle sensor deviceBOSCH GMBH ROBERT·Filed 2019·Granted Mar 2, 2021·0 cites·14 claims
- 0752US10782221B2System and method for determining a particle contaminationBOSCH GMBH ROBERT·Filed 2019·Granted Sep 22, 2020·0 cites·15 claims
- 0845US10429239B2Color capture arrangement and correction method using the color capture arrangementSENSOPART IND GMBH·Filed 2018·Granted Oct 1, 2019·0 cites·11 claims
- 0944US4813159AFoot support for optimum recoveryWEISS ROBERT F·Filed 1987·Granted Mar 21, 1989·23 cites·32 claims
- 1040US2017164688A1Orthotic SystemWEISS ROBERT F·Filed 2016·Application pending·0 cites
- 1127US4674201AFoot supportWEISS ROBERT F·Filed 1985·Granted Jun 23, 1987·6 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →