Inventor · disambiguated record
Robert L. Zwingman
Also filed as: ZWINGMAN ROBERT L
11 granted patents·105 citations·filing 1978–2014
85Inventor score
Files withNEWPORT FAB LLC6BURROUGHS CORP2HURWITZ PAUL D1ROCKWELL INTERNATIONAL CORP1ZWINGMAN ROBERT L1
Top patents by PatentIndex Score
11 records- 0186US4676867APlanarization process for double metal MOS using spin-on glass as a sacrificial layerROCKWELL INTERNATIONAL CORP·Filed 1986·Granted Jun 30, 1987·97 cites·17 claims
- 0269US8963247B2Selective amorphization for electrical signal isolation and linearity in SOI structuresNEWPORT FAB LLC·Filed 2012·Granted Feb 24, 2015·2 cites·15 claims
- 0363US8956949B2Electrical signal isolation in semiconductor structuresNEWPORT FAB LLC·Filed 2014·Granted Feb 17, 2015·1 cites·20 claims
- 0462US9362160B2SOI structure and method for utilizing trenches for signal isolation and linearityNEWPORT FAB LLC·Filed 2012·Granted Jun 7, 2016·1 cites·20 claims
- 0553US9634089B2Selective amorphization for signal isolation and linearityNEWPORT FAB LLC·Filed 2014·Granted Apr 25, 2017·0 cites·19 claims
- 0653US9343353B2SOI structure for signal isolation and linearityNEWPORT FAB LLC·Filed 2014·Granted May 17, 2016·0 cites·18 claims
- 0752US7745886B2Semiconductor on insulator (SOI) switching circuitNEWPORT FAB LLC·Filed 2008·Granted Jun 29, 2010·0 cites·19 claims
- 0845US9412758B2Semiconductor on insulator (SOI) structure with more predictable junction capacitance and method for fabricationZWINGMAN ROBERT L·Filed 2008·Granted Aug 9, 2016·0 cites·14 claims
- 0944US8816471B2Electrical signal isolation and linearity in SOI structuresHURWITZ PAUL D·Filed 2012·Granted Aug 26, 2014·0 cites·12 claims
- 1037US4195261AMethod and apparatus for measuring the stripe width and collapse field of magnetic materialsBURROUGHS CORP·Filed 1978·Granted Mar 25, 1980·4 cites·7 claims
- 1129US4179749ADefect tolerant scheme for a bubble lattice fileBURROUGHS CORP·Filed 1978·Granted Dec 18, 1979·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →