Inventor · disambiguated record
Ruochong Fei
Also filed as: FEI RUOCHONG
2 granted patents·0 citations·filing 2019–2021
25Inventor score
Files withASML NETHERLANDS BV2
Top patents by PatentIndex Score
2 records- 0158US12505974B2Systems and methods for focusing charged—particle beamsASML NETHERLANDS BV·Filed 2019·Granted Dec 23, 2025·0 cites·16 claims
- 0252US11694312B2Image enhancement for multi-layered structure in charged-particle beam inspectionASML NETHERLANDS BV·Filed 2021·Granted Jul 4, 2023·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →