Inventor · disambiguated record
Ruben Cornelis Maas
Also filed as: MAAS RUBEN CORNELIS
4 granted patents·3 pending applications·4 citations·filing 2019–2025
62Inventor score
Files withASML NETHERLANDS BV7
Top patents by PatentIndex Score
7 records- 0189US12332573B2Method for determining defectiveness of pattern based on after development imageASML NETHERLANDS BV·Filed 2020·Granted Jun 17, 2025·3 cites·15 claims
- 0269US11996267B2Particle beam apparatus, defect repair method, lithographic exposure process and lithographic systemASML NETHERLANDS BV·Filed 2019·Granted May 28, 2024·1 cites·20 claims
- 0365US2025237967A1Method for determining defectiveness of pattern based on after development imageASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0463US11733614B2Method of metrology and associated apparatusesASML NETHERLANDS BV·Filed 2021·Granted Aug 22, 2023·0 cites·18 claims
- 0558US11112703B2Method of metrology and associated apparatusesASML NETHERLANDS BV·Filed 2019·Granted Sep 7, 2021·0 cites·19 claims
- 0650US2025013158A1Surrounding pattern and process aware metrologyASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0740US2021079519A1Method and apparatus for forming a patterned layer of materialASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →