Inventor · disambiguated record
Ruriko Tsuneta
Also filed as: TSUNETA RURIKO
18 granted patents·4 pending applications·490 citations·filing 1994–2024
95Inventor score
Top patents by PatentIndex Score
22 records- 0195US6838667B2Method and apparatus for charged particle beam microscopyHITACHI LTD·Filed 2001·Granted Jan 4, 2005·59 cites·17 claims
- 0292US7372029B2Scanning transmission electron microscope and scanning transmission electron microscopyHITACHI HIGH TECH CORP·Filed 2007·Granted May 13, 2008·15 cites·8 claims
- 0392US7372051B2Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement systemHITACHI HIGH TECH CORP·Filed 2005·Granted May 13, 2008·19 cites·10 claims
- 0492US6570156B1Autoadjusting electron microscopeHITACHI LTD·Filed 2000·Granted May 27, 2003·100 cites·11 claims
- 0591US5866905AElectron microscopeHITACHI LTD·Filed 1996·Granted Feb 2, 1999·74 cites·12 claims
- 0690US6051834AElectron microscopeHITACHI LTD·Filed 1998·Granted Apr 18, 2000·65 cites·2 claims
- 0788US7863564B2Electric charged particle beam microscope and microscopyHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 4, 2011·13 cites·7 claims
- 0888US7633064B2Electric charged particle beam microscopy and electric charged particle beam microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Dec 15, 2009·11 cites·13 claims
- 0984US7227144B2Scanning transmission electron microscope and scanning transmission electron microscopyHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 5, 2007·7 cites·10 claims
- 1081US8993961B2Electric charged particle beam microscope and electric charged particle beam microscopyTSUNETA RURIKO·Filed 2011·Granted Mar 31, 2015·6 cites·10 claims
- 1180US5453617AElectron microscope for specimen composition and strain analysis and observation method thereofHITACHI LTD·Filed 1994·Granted Sep 26, 1995·36 cites·22 claims
- 1279US8334519B2Multi-part specimen holder with conductive patternsONO SHIANO·Filed 2007·Granted Dec 18, 2012·11 cites·15 claims
- 1377US5650621AElectron microscopeHITACHI LTD·Filed 1995·Granted Jul 22, 1997·31 cites·8 claims
- 1476US6888139B2Electron microscopeHITACHI LTD·Filed 2003·Granted May 3, 2005·28 cites·4 claims
- 1570US9830524B2Method for estimating shape before shrink and CD-SEM apparatusSEKIGUCHI TOMOKO·Filed 2012·Granted Nov 28, 2017·4 cites·13 claims
- 1668US8442300B2Specified position identifying method and specified position measuring apparatusTSUNETA RURIKO·Filed 2007·Granted May 14, 2013·6 cites·9 claims
- 1765US8963102B2Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopyHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 24, 2015·1 cites·15 claims
- 1860US7141790B2Defect inspection instrument and positron beam apparatusHITACHI LTD·Filed 2004·Granted Nov 28, 2006·4 cites·11 claims
- 1958US2025077906A1Physical property information retrieval system, physical property information retrieval method, and storage medium storing physical property information retrieval programHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 2054US2002099573A1Network solution system of analysis and evaluationHITACHI LTD·Filed 2002·Application pending·0 cites
- 2151US2008283748A1Electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 2235US2012104253A1Charged particle beam microscope and measuring method using sameTSUNETA RURIKO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →