Inventor · disambiguated record
Ryoji Hagiwara
Also filed as: HAGIWARA RYOJI
18 granted patents·1 pending application·315 citations·filing 1988–2009
95Inventor score
Top patents by PatentIndex Score
19 records- 0195US5608670AFlash memory with improved erasability and its circuitryFUJITSU LTD·Filed 1995·Granted Mar 4, 1997·66 cites·8 claims
- 0288US5576637AXOR CMOS logic gateFUJITSU LTD·Filed 1995·Granted Nov 19, 1996·40 cites·1 claims
- 0383US7375352B2Photomask defect correction method employing a combined device of a focused electron beam device and an atomic force microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted May 20, 2008·9 cites·15 claims
- 0482US4937830ASemiconductor memory device having function of checking and correcting error of read-out dataFUJITSU LTD·Filed 1988·Granted Jun 26, 1990·70 cites·10 claims
- 0578US7018683B2Electron beam processing methodSII NANOTECHNOLOGY INC·Filed 2004·Granted Mar 28, 2006·16 cites·12 claims
- 0676US5770963AFlash memory with improved erasability and its circuitryFUJITSU LTD·Filed 1995·Granted Jun 23, 1998·19 cites·2 claims
- 0775US5592419AFlash memory with improved erasability and its circuitryFUJITSU LTD·Filed 1995·Granted Jan 7, 1997·23 cites·1 claims
- 0874US6891171B1Method for repairing a phase shift mask and a focused ion beam apparatus for carrying out methodSII NANOTECHNOLOGY INC·Filed 2000·Granted May 10, 2005·13 cites·30 claims
- 0968US7488961B2Charged particle beam irradiation method and charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Feb 10, 2009·2 cites·5 claims
- 1068US7485880B2Charged particle beam scan and irradiation method, charged particle beam apparatus, workpiece observation method and workpiece processing methodSII NANOTECHNOLOGY INC·Filed 2006·Granted Feb 3, 2009·2 cites·8 claims
- 1164US7927769B2Method for fabricating EUVL maskSII NANOTECHNOLOGY INC·Filed 2009·Granted Apr 19, 2011·1 cites·11 claims
- 1261US5631597ANegative voltage circuit for a flash memoryFUJITSU LTD·Filed 1995·Granted May 20, 1997·10 cites·5 claims
- 1359US6303930B1Coordinating optical type observing apparatus and laser marking methodSEIKO INSTR INC·Filed 1999·Granted Oct 16, 2001·24 cites·16 claims
- 1448US7576340B2Focused ion beam processing methodSII NANOTECHNOLOGY INC·Filed 2006·Granted Aug 18, 2009·0 cites·10 claims
- 1544US2007114460A1Charged particle beam processing method and charged particle beam apparatusMURAMATSU MASASHI·Filed 2006·Application pending·0 cites
- 1642US5079423AX-ray image sensorSEIKO INSTR INC·Filed 1990·Granted Jan 7, 1992·7 cites·17 claims
- 1740US6780551B2Charged particle processing for forming pattern boundaries at a uniform thicknessSII NANOTECHNOLOGY INC·Filed 2001·Granted Aug 24, 2004·0 cites·20 claims
- 1840US5109159AX-ray image sensorSEIKO INSTR INC·Filed 1990·Granted Apr 28, 1992·6 cites·12 claims
- 1939US5249156ASemiconductor memory device having non-volatile and volatile memory cellsFUJITSU LTD·Filed 1991·Granted Sep 28, 1993·7 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →