Inventor · disambiguated record
Ryuji Omura
Also filed as: OMURA RYUJI
5 granted patents·165 citations·filing 1991–2001
84Inventor score
Top patents by PatentIndex Score
5 records- 0192US6345004B1Repair analysis circuit for redundancy, redundant repairing method, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 5, 2002·86 cites·8 claims
- 0263US6311300B1Semiconductor testing apparatus for testing semiconductor device including built in self test circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 30, 2001·22 cites·7 claims
- 0361US6584592B2Semiconductor testing apparatus for testing semiconductor device including built in self test circuitRYODEN SEMICONDUCTOR SYST ENG·Filed 2001·Granted Jun 24, 2003·9 cites·8 claims
- 0461US5164665AIC testerMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Nov 17, 1992·24 cites·2 claims
- 0560US5142223ADevice for testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Aug 25, 1992·24 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →