Inventor · disambiguated record
Ryoji Yoshikawa
Also filed as: YOSHIKAWA RYOJI
10 granted patents·6 pending applications·18 citations·filing 2004–2023
81Inventor score
Top patents by PatentIndex Score
16 records- 0175US7742162B2Mask defect inspection data generating method, mask defect inspection method and mask production methodTOSHIBA KK·Filed 2008·Granted Jun 22, 2010·5 cites·14 claims
- 0267US7602961B2Reference data generating method, pattern defect checking apparatus, pattern defect checking method, reference data generating program, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2004·Granted Oct 13, 2009·9 cites·12 claims
- 0366US9894271B2Pattern inspection apparatus and pattern inspection methodTOSHIBA MEMORY CORP·Filed 2015·Granted Feb 13, 2018·1 cites·19 claims
- 0464US8811713B2Photomask inspection method, semiconductor device inspection method, and pattern inspection apparatusYOSHIKAWA RYOJI·Filed 2009·Granted Aug 19, 2014·3 cites·6 claims
- 0563US11906440B2Inspection device and inspection methodKIOXIA CORP·Filed 2022·Granted Feb 20, 2024·0 cites·20 claims
- 0660US11664190B2Electron beam device and image acquisition methodKIOXIA CORP·Filed 2021·Granted May 30, 2023·0 cites·20 claims
- 0751US8358340B2Pattern inspection device and method of inspecting patternTOSHIBA KK·Filed 2009·Granted Jan 22, 2013·0 cites·11 claims
- 0850US10976656B2Defect inspection device and defect inspection methodTOSHIBA MEMORY CORP·Filed 2018·Granted Apr 13, 2021·0 cites·22 claims
- 0950US2022035243A1Original plate manufacturing method, drawing data creation method, and pattern defect repairing methodKIOXIA CORP·Filed 2021·Application pending·0 cites
- 1049US2023410283A1Inspection apparatus, method of manufacturing template, and method of inspecting templateKIOXIA CORP·Filed 2023·Application pending·0 cites
- 1148US9244343B2Pattern forming method and mask pattern dataTOSHIBA KK·Filed 2014·Granted Jan 26, 2016·0 cites·19 claims
- 1247US2014232032A1Lithography original checking device, lithography original checking method, and pattern data creating methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1345US11978195B2Inspection method and inspection apparatusKIOXIA CORP·Filed 2021·Granted May 7, 2024·0 cites·16 claims
- 1445US2014314305A1Template inspection deviceTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1543US2008055606A1Apparatus and method for inspecting a pattern and method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2007·Application pending·0 cites
- 1633US2011237087A1Pattern inspection method and semiconductor device manufacturing methodYOSHIKAWA RYOJI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →