Inventor · disambiguated record
Satya N. Chakravarti
Also filed as: CHAKRAVARTI SATYA · CHAKRAVARTI SATYA N · CHAKRAVARTI SATYA NARAYAN
19 granted patents·2 pending applications·448 citations·filing 1979–2012
95Inventor score
Top patents by PatentIndex Score
21 records- 0195US7001844B2Material for contact etch layer to enhance device performanceIBM·Filed 2004·Granted Feb 21, 2006·74 cites·35 claims
- 0290US4300210ACalibrated sensing systemIBM·Filed 1979·Granted Nov 10, 1981·39 cites·21 claims
- 0389US5909044AProcess for forming a high density semiconductor deviceIBM·Filed 1997·Granted Jun 1, 1999·57 cites·16 claims
- 0486US4542340ATesting method and structure for leakage current characterization in the manufacture of dynamic RAM cellsIBM·Filed 1982·Granted Sep 17, 1985·46 cites·14 claims
- 0585US4287571AHigh density transistor arraysIBM·Filed 1979·Granted Sep 1, 1981·55 cites·24 claims
- 0680US7531886B2MOSFET fuse programmed by electromigrationIBM·Filed 2006·Granted May 12, 2009·9 cites·14 claims
- 0780US6436760B1Method for reducing surface oxide in polysilicon processingIBM·Filed 2001·Granted Aug 20, 2002·23 cites·19 claims
- 0878US8237457B2Replacement-gate-compatible programmable electrical antifuseCHAKRAVARTI SATYA N·Filed 2009·Granted Aug 7, 2012·8 cites·20 claims
- 0975US6204112B1Process for forming a high density semiconductor deviceIBM·Filed 1999·Granted Mar 20, 2001·26 cites·17 claims
- 1074US6339228B1DRAM cell buried strap leakage measurement structure and methodIBM·Filed 1999·Granted Jan 15, 2002·45 cites·21 claims
- 1173US8097520B2Integration of passive device structures with metal gate layersBU HUIMING·Filed 2009·Granted Jan 17, 2012·5 cites·14 claims
- 1272US4897154APost dry-etch cleaning method for restoring wafer propertiesIBM·Filed 1986·Granted Jan 30, 1990·39 cites·19 claims
- 1370US8441039B2Nanopillar E-fuse structure and processIBM·Filed 2012·Granted May 14, 2013·2 cites·11 claims
- 1468US8258037B2Nanopillar decoupling capacitorCHAKRAVARTI SATYA N·Filed 2009·Granted Sep 4, 2012·3 cites·7 claims
- 1568US6528383B1Simultaneous formation of deep trench capacitor and resistorIBM·Filed 2001·Granted Mar 4, 2003·14 cites·7 claims
- 1665US8344428B2Nanopillar E-fuse structure and processIBM·Filed 2009·Granted Jan 1, 2013·2 cites·20 claims
- 1758US8053317B2Method and structure for improving uniformity of passive devices in metal gate technologyIBM·Filed 2009·Granted Nov 8, 2011·1 cites·25 claims
- 1851US8680651B2Nanopillar decoupling capacitorCHAKRAVARTI SATYA N·Filed 2012·Granted Mar 25, 2014·0 cites·19 claims
- 1948US9059006B2Replacement-gate-compatible programmable electrical antifuseCHAKRAVARTI SATYA N·Filed 2012·Granted Jun 16, 2015·0 cites·20 claims
- 2047US2006040497A1Material for contact etch layer to enhance device performanceCHAKRAVARTI ASHIMA B·Filed 2005·Application pending·0 cites
- 2141US2010078727A1eFuse and Resistor Structures and Method for Forming Same in Active RegionMIN BYOUNG W·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →