Inventor · disambiguated record
Sandip Halder
Also filed as: HALDER SANDIP
11 granted patents·4 pending applications·6 citations·filing 2008–2023
80Inventor score
Top patents by PatentIndex Score
15 records- 0183US10732124B2Methods for detecting defects of a lithographic patternIMEC VZW·Filed 2018·Granted Aug 4, 2020·3 cites·15 claims
- 0270US10061209B2Method for verifying a pattern of features printed by a lithography processIMEC VZW·Filed 2016·Granted Aug 28, 2018·2 cites·14 claims
- 0359US8460946B2Methods of processing and inspecting semiconductor substratesMARKWORT LARS·Filed 2011·Granted Jun 11, 2013·1 cites·20 claims
- 0459US2025076866A1Reinforcement Learning (RL) Based Federated Automated Defect Classification and DetectionIMEC VZW·Filed 2023·Application pending·0 cites
- 0557US2025076865A1Reinforcement Learning (RL) Based Federated Automated Defect Classification and DetectionIMEC VZW·Filed 2023·Application pending·0 cites
- 0656US12511773B2Wafer image denoising and contour extraction for manufacturing process calibrationSIEMENS IND SOFTWARE INC·Filed 2022·Granted Dec 30, 2025·0 cites·20 claims
- 0754US12066763B2Sensitivity improvement of optical and SEM defection inspectionKLA CORP·Filed 2021·Granted Aug 20, 2024·0 cites·45 claims
- 0851US2023343078A1Automated defect classification and detectionIMEC VZW·Filed 2023·Application pending·0 cites
- 0950US12243193B2Method for de-noising an electron microscope imageIMEC VZW·Filed 2021·Granted Mar 4, 2025·0 cites·19 claims
- 1042US9983154B2Method for inspecting a pattern of features on a semiconductor dieIMEC VZW·Filed 2016·Granted May 29, 2018·0 cites·20 claims
- 1142US8513163B2Substrate for a superconducting thin-film strip conductorBAECKER MICHAEL·Filed 2008·Granted Aug 20, 2013·0 cites·19 claims
- 1237US10818504B2Method for producing a pattern of features by lithography and etchingIMEC VZW·Filed 2018·Granted Oct 27, 2020·0 cites·17 claims
- 1335US8735182B2Method for detecting embedded voids in a semiconductor substrateLEUNISSEN LEONARDUS·Filed 2012·Granted May 27, 2014·0 cites·16 claims
- 1433US9874821B2Method for hotspot detection and ranking of a lithographic maskIMEC VZW·Filed 2016·Granted Jan 23, 2018·0 cites·8 claims
- 1528US2010224215A1Method for Reducing the Damage Induced by a Physical Force Assisted CleaningIMEC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →