Inventor · disambiguated record
Satoru Iwama
Also filed as: IWAMA SATORU
5 granted patents·1 pending application·21 citations·filing 2004–2013
76Inventor score
Top patents by PatentIndex Score
6 records- 0178US8481934B2Method for inspecting and measuring sample and scanning electron microscopeEZUMI MAKOTO·Filed 2011·Granted Jul 9, 2013·3 cites·8 claims
- 0278US6995370B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Feb 7, 2006·12 cites·8 claims
- 0377US7960696B2Method for inspecting and measuring sample and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 14, 2011·4 cites·4 claims
- 0471US7375329B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted May 20, 2008·2 cites·10 claims
- 0558US2014001359A1Method for inspecting and measuring sample and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0648US7723681B2Observation method with electron beamHITACHI HIGH TECH CORP·Filed 2007·Granted May 25, 2010·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →