Inventor · disambiguated record
Satoshi Iwamoto
Also filed as: IWAMOTO SATOSHI
29 granted patents·2 pending applications·223 citations·filing 1994–2023
96Inventor score
Top patents by PatentIndex Score
31 records- 0187US7398169B2Measuring apparatus, measuring method, testing apparatus, testing method, and electronics deviceADVANTEST CORP·Filed 2006·Granted Jul 8, 2008·15 cites·26 claims
- 0283US5866298ARadiation sensitive composition for color filtersJSR CORP·Filed 1996·Granted Feb 2, 1999·60 cites·11 claims
- 0381US7158908B2Test apparatus, diagnosing program and diagnosing method thereforADVANTEST CORP·Filed 2005·Granted Jan 2, 2007·8 cites·7 claims
- 0477US7802140B2Diagnostic program, a switching program, a testing apparatus, and a diagnostic methodADVANTEST CORP·Filed 2005·Granted Sep 21, 2010·9 cites·7 claims
- 0576US6323298B1Propylene-based polymer, method for its production, composition thereof, catalyst component for polymerization, and method for its productionSHOWA DENKO KK·Filed 2000·Granted Nov 27, 2001·13 cites·11 claims
- 0676US6184328B1Propylene-based polymer, method for its production, composition thereof, catalyst component for polymerization, and method for its productionSHOWA DENKO KK·Filed 1998·Granted Feb 6, 2001·30 cites·4 claims
- 0775US8362791B2Test apparatus additional module and test methodADVANTEST CORP·Filed 2009·Granted Jan 29, 2013·8 cites·18 claims
- 0875US7552028B2Recording medium, test apparatus and diagnostic methodADVANTEST CORP·Filed 2006·Granted Jun 23, 2009·5 cites·7 claims
- 0973US8155541B2Fixing device which detects anomaly of heaterIWAMOTO SATOSHI·Filed 2010·Granted Apr 10, 2012·2 cites·19 claims
- 1071US7598589B2Semiconductor devicePANASONIC CORP·Filed 2005·Granted Oct 6, 2009·4 cites·4 claims
- 1170US12415372B2Printer having sensor to detect remaining wound amount of label paperTOSHIBA TEC KK·Filed 2023·Granted Sep 16, 2025·0 cites·9 claims
- 1269US10289043B2Fixing device and image forming apparatusTOSHIBA KK·Filed 2018·Granted May 14, 2019·0 cites·10 claims
- 1368US9871347B2Semiconductor light emitting device and optical transceiverFUJITSU LTD·Filed 2016·Granted Jan 16, 2018·1 cites·13 claims
- 1467US8427188B2Test apparatusIWAMOTO SATOSHI·Filed 2010·Granted Apr 23, 2013·2 cites·10 claims
- 1567US8261119B2Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test moduleIWAMOTO SATOSHI·Filed 2009·Granted Sep 4, 2012·5 cites·20 claims
- 1665US10101693B2Fixing device and image forming apparatusTOSHIBA KK·Filed 2017·Granted Oct 16, 2018·0 cites·10 claims
- 1765US5973542ADriver circuit with temperature correction circuitADVANTEST CORP·Filed 1997·Granted Oct 26, 1999·20 cites·7 claims
- 1864US12099263B2Magneto-optical material and production method thereforRES INSTITUTE FOR ELECTROMAGNETIC MATERIALS·Filed 2022·Granted Sep 24, 2024·0 cites·18 claims
- 1962US7906981B1Test apparatus and test methodADVANTEST CORP·Filed 2009·Granted Mar 15, 2011·4 cites·7 claims
- 2062US5916990APropylene-based polymer, method of its production, composition thereof, catalyst component for polymerization, and method for its productionSHOWA DENKO KK·Filed 1994·Granted Jun 29, 1999·14 cites·4 claims
- 2160US9727009B2Fixing device and image forming apparatusTOSHIBA KK·Filed 2015·Granted Aug 8, 2017·0 cites·9 claims
- 2256US7141355B2Radiation-sensitive resin compositionJSR CORP·Filed 2002·Granted Nov 28, 2006·5 cites·18 claims
- 2355US7876118B2Test equipmentADVANTEST CORP·Filed 2009·Granted Jan 25, 2011·2 cites·6 claims
- 2454US6094085ADriver circuit with temperature correction circuitADVANTEST CORP·Filed 1998·Granted Jul 25, 2000·12 cites·13 claims
- 2552US8405415B2Test apparatus synchronous module and synchronous methodIWAMOTO SATOSHI·Filed 2009·Granted Mar 26, 2013·2 cites·22 claims
- 2651US7781291B2Semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2009·Granted Aug 24, 2010·0 cites·6 claims
- 2747US7610538B2Test apparatus and performance board for diagnosisADVANTEST CORP·Filed 2007·Granted Oct 27, 2009·0 cites·10 claims
- 2842US2018229530A1Control device, image processing apparatus and method for realizing efficiency use of energyTOSHIBA KK·Filed 2017·Application pending·0 cites
- 2936US2008133165A1Test apparatus and device interfaceADVANTEST CORP·Filed 2007·Application pending·0 cites
- 3032US5691070APolyolefin composition, molded article thereof and multilayered laminateSHOWA DENKO KK·Filed 1996·Granted Nov 25, 1997·2 cites·4 claims
- 3130US5589547APolyolefin composition, molded article thereof and multilayered laminateSHOWA DENKO KK·Filed 1994·Granted Dec 31, 1996·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →