Inventor · disambiguated record
Samer Kabbani
Also filed as: KABBANI SAMER · KABBANI SAMER M · KABBANI SAMER MAHMOUD
47 granted patents·15 pending applications·496 citations·filing 1999–2025
98Inventor score
Files withADVANTEST TEST SOLUTIONS INC29DELTA DESIGN INC13AEM SINGAPORE PTE LTD8FASTAR LTD5AEM HOLDINGS LTD4
Top patents by PatentIndex Score
62 records- 0198US11587640B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Feb 21, 2023·6 cites·15 claims
- 0298US11573262B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Feb 7, 2023·9 cites·21 claims
- 0397US11674999B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Jun 13, 2023·10 cites·25 claims
- 0497US7626407B2Miniature fluid-cooled heat sink with integral heaterDELTA DESIGN INC·Filed 2006·Granted Dec 1, 2009·65 cites·15 claims
- 0596US11852678B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 26, 2023·2 cites·21 claims
- 0696US11828795B1Test system with a thermal head comprising a plurality of adapters for independent thermal control of zonesAEM HOLDINGS LTD·Filed 2022·Granted Nov 28, 2023·10 cites·31 claims
- 0796US11821913B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 21, 2023·4 cites·20 claims
- 0896US11796589B1Thermal head for independent control of zonesAEM HOLDINGS LTD·Filed 2022·Granted Oct 24, 2023·4 cites·30 claims
- 0996US11693051B1Thermal head for independent control of zonesAEM HOLDINGS LTD·Filed 2022·Granted Jul 4, 2023·7 cites·30 claims
- 1096US11656272B1Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zonesAEM HOLDINGS LTD·Filed 2022·Granted May 23, 2023·11 cites·25 claims
- 1196US11567119B2Testing system including active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jan 31, 2023·10 cites·14 claims
- 1295US11754620B2DUT placement and handling for active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Sep 12, 2023·2 cites·24 claims
- 1395US11493551B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2020·Granted Nov 8, 2022·28 cites·16 claims
- 1493US11742055B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Aug 29, 2023·2 cites·20 claims
- 1592US7336197B2LED lighting system for line scan camera based multiple data matrix scannersDELTA DESIGN INC·Filed 2006·Granted Feb 26, 2008·54 cites·10 claims
- 1691US12085609B1Thermal control wafer with integrated heating-sensing elementsAEM SINGAPORE PTE LTD·Filed 2023·Granted Sep 10, 2024·1 cites·28 claims
- 1791US6678583B2Robotic storage buffer system for substrate carrier podsSEMINET INC·Filed 2002·Granted Jan 13, 2004·107 cites·8 claims
- 1890US12013432B1Thermal control wafer with integrated heating-sensing elementsAEM SINGAPORE PTE LTD·Filed 2023·Granted Jun 18, 2024·1 cites·29 claims
- 1989US12000885B1Multiplexed thermal control wafer and coldplateAEM SINGAPORE PTE LTD·Filed 2023·Granted Jun 4, 2024·1 cites·29 claims
- 2088US2025093408A1Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 2187US11808812B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 7, 2023·1 cites·20 claims
- 2287US7355428B2Active thermal control system with miniature liquid-cooled temperature control device for electronic device testingDELTA DESIGN INC·Filed 2004·Granted Apr 8, 2008·54 cites·9 claims
- 2387US2025130276A1Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 2485US6540833B1Moving head coating apparatus and methodFASTAR LTD·Filed 1999·Granted Apr 1, 2003·41 cites·98 claims
- 2585US2025102565A1Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 2683US12216154B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 2782US12203979B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
- 2881US12374420B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 29, 2025·0 cites·20 claims
- 2981US12345756B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 1, 2025·0 cites·18 claims
- 3081US12320852B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jun 3, 2025·0 cites·20 claims
- 3180US12259427B2Thermal head comprising a plurality of adapters for independent thermal control of zonesAEM SINGAPORE PTE LTD·Filed 2023·Granted Mar 25, 2025·0 cites·22 claims
- 3280US12259428B1Multiplexed thermal control wafer and coldplateAEM SINGAPORE PTE LTD·Filed 2024·Granted Mar 25, 2025·0 cites·23 claims
- 3380US12203958B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 21, 2025·0 cites·17 claims
- 3480US2024329120A1Thermal head comprising a plurality of adapters for independent thermal control of zonesAEM SINGAPORE PTE LTD·Filed 2024·Application pending·0 cites
- 3579US11846669B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 19, 2023·0 cites·29 claims
- 3679US11774492B2Test system including active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Oct 3, 2023·0 cites·23 claims
- 3779US2025067797A1Thermal control wafer with integrated heating-sensing elementsAEM SINGAPORE PTE LTD·Filed 2024·Application pending·0 cites
- 3878US11940487B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Mar 26, 2024·0 cites·20 claims
- 3977US11609266B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Mar 21, 2023·0 cites·18 claims
- 4075US12320841B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jun 3, 2025·0 cites·27 claims
- 4175US9557375B2Group vision alignment for double sided IC device testingDELTA DESIGN INC·Filed 2015·Granted Jan 31, 2017·2 cites·25 claims
- 4275US9219885B2Imaging system with defocused and aperture-cropped light sources for detecting surface characteristicsDING KEXIANG KEN·Filed 2012·Granted Dec 22, 2015·3 cites·30 claims
- 4375US7160389B2System and method for cleaning and priming an extrusion headFASTAR LTD·Filed 2002·Granted Jan 9, 2007·13 cites·20 claims
- 4475US2025244380A1Multiplexed thermal control wafer and coldplateAEM SINGAPORE PTE LTD·Filed 2025·Application pending·0 cites
- 4574US11841392B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 12, 2023·0 cites·27 claims
- 4673US8040145B2Miniature fluid-cooled heat sink with integral heaterDELTA DESIGN INC·Filed 2009·Granted Oct 18, 2011·4 cites·15 claims
- 4772US11549981B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 4867US7700891B2Process for handling semiconductor devices and transport media in automated sorting equipmentDELTA DESIGN INC·Filed 2006·Granted Apr 20, 2010·3 cites·5 claims
- 4967US6387184B1System and method for interchangeably interfacing wet components with a coating apparatusFASTAR LTD·Filed 1999·Granted May 14, 2002·21 cites·88 claims
- 5063US7169229B2Moving head, coating apparatusFASTAR LTD·Filed 2003·Granted Jan 30, 2007·6 cites·18 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →