Inventor · disambiguated record
Sang-Kyoung Lee
Also filed as: LEE SANG ICK · LEE SANG-KYOUNG
11 granted patents·1 pending application·129 citations·filing 1998–2010
88Inventor score
Top patents by PatentIndex Score
12 records- 0191US6734925B1Multiple testing bars for testing liquid crystal display and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted May 11, 2004·90 cites·30 claims
- 0289US7081770B2Multiple testing bars for testing liquid crystal display and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jul 25, 2006·7 cites·12 claims
- 0382US6982569B2Multiple testing bars for testing liquid crystal display and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 3, 2006·17 cites·9 claims
- 0480US7410869B2Method of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 12, 2008·7 cites·14 claims
- 0577US7626414B2Multiple testing bars for testing liquid crystal display and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Dec 1, 2009·3 cites·13 claims
- 0671US7446556B2Multiple testing bars for testing liquid crystal display and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 4, 2008·1 cites·12 claims
- 0764USRE41873EMultiple testing bars for testing liquid crystal display and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 26, 2010·2 cites·30 claims
- 0856US8749362B2Apparatus and method for providing haptic function in portable terminalLEE SANG-KYOUNG·Filed 2010·Granted Jun 10, 2014·1 cites·15 claims
- 0956US8310262B2Multiple testing bars for testing liquid crystal display and method thereofLEE SANG-KYOUNG·Filed 2009·Granted Nov 13, 2012·1 cites·17 claims
- 1044US7579237B2Nonvolatile memory device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 25, 2009·0 cites·20 claims
- 1139US8431983B2Non-volatile memory device and method of fabricating the sameLEE WOONG·Filed 2009·Granted Apr 30, 2013·0 cites·9 claims
- 1237US2003216003A1Method of forming flash memory deviceFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →