Inventor · disambiguated record
Sangkil Lee
Also filed as: LEE SANGKIL
14 granted patents·4 pending applications·26 citations·filing 2013–2024
88Inventor score
Top patents by PatentIndex Score
18 records- 0184US9466537B2Method of inspecting semiconductor device and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Oct 11, 2016·5 cites·20 claims
- 0283US11251155B2Semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 15, 2022·3 cites·16 claims
- 0382US9579589B1Block assemblyLEE SANGKIL·Filed 2016·Granted Feb 28, 2017·9 cites·15 claims
- 0477US11955458B2Semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Apr 9, 2024·0 cites·20 claims
- 0577US11062751B2Memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 13, 2021·3 cites·13 claims
- 0670US12119336B2Fusion memory device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 15, 2024·0 cites·20 claims
- 0770US11922984B2Memory device having volatile and non-volatile memory cellsSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Mar 5, 2024·0 cites·10 claims
- 0870US11688719B2Semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 27, 2023·0 cites·8 claims
- 0970US9583402B2Method of manufacturing a semiconductor device using semiconductor measurement systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 28, 2017·2 cites·19 claims
- 1070US9267903B2Methods and apparatuses for inspecting semiconductor devices using electron beamsPARK MIRA·Filed 2013·Granted Feb 23, 2016·4 cites·24 claims
- 1163US11482267B2Memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Oct 25, 2022·0 cites·5 claims
- 1256US2024389364A1Computing device and computing system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1355US11462528B2Fusion memory device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 4, 2022·0 cites·20 claims
- 1451US2023309317A1Semiconductor Memory DeviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1548US10845232B2Mass flow controller, apparatus for manufacturing semiconductor device, and method for maintenance thereofSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 24, 2020·0 cites·20 claims
- 1644US2024249788A1Memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1738US9455121B2Semiconductor inspection system and methods of inspecting a semiconductor device using the sameKIM HYUNWOO·Filed 2015·Granted Sep 27, 2016·0 cites·18 claims
- 1834US2017200658A1Methods of inspecting substrates and semiconductor fabrication methods incorporating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →