Inventor · disambiguated record
Satoru Niimura
Also filed as: NIIMURA SATORU
9 granted patents·726 citations·filing 1988–2002
91Inventor score
Top patents by PatentIndex Score
9 records- 0192US7206080B2Surface shape measurement apparatus, surface shape measurement method, surface state graphic apparatusTOPCON CORP·Filed 2002·Granted Apr 17, 2007·60 cites·12 claims
- 0288US5106364ASurgical cutterTOPCON CORP·Filed 1990·Granted Apr 21, 1992·497 cites·5 claims
- 0383US4941744AIntegrated-photocircuit interferometerTOKYO OPTICAL·Filed 1988·Granted Jul 17, 1990·40 cites·8 claims
- 0468US6217172B1Ophthalmologic measuring systemTOPCON CORP·Filed 2000·Granted Apr 17, 2001·54 cites·7 claims
- 0553US4973153AMethod and apparatus for finding rangeTOPCON CORP·Filed 1988·Granted Nov 27, 1990·14 cites·7 claims
- 0653US4909629ALight interferometerTOPCON CORP·Filed 1988·Granted Mar 20, 1990·14 cites·21 claims
- 0747US4986653ALight wave range finderTOPCON CORP·Filed 1988·Granted Jan 22, 1991·13 cites·12 claims
- 0838US5633694AOphthalmometric apparatus for generating an image of a selection and a surface of an eyeground of a subjectTOPCON CORP·Filed 1995·Granted May 27, 1997·26 cites·24 claims
- 0928US5717481APerimetric measurement apparatus for measuring characteristics of X ganglion cellsTOPCON CORP·Filed 1995·Granted Feb 10, 1998·8 cites·22 claims
Join the waitlist — get patent alerts
Get an alert when Satoru Niimura files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →