Inventor · disambiguated record
Samvel Shoukourian
Also filed as: SHOUKOURIAN SAMVEL
11 granted patents·1 pending application·37 citations·filing 2007–2022
85Inventor score
Top patents by PatentIndex Score
12 records- 0179US11023310B1Detection of address errors in memory devices using multi-segment error detection codesSYNOPSYS INC·Filed 2019·Granted Jun 1, 2021·3 cites·20 claims
- 0278US7768840B1Memory modeling using an intermediate level structural descriptionVIRAGE LOGIC CORP·Filed 2007·Granted Aug 3, 2010·13 cites·19 claims
- 0375US8112730B2Various methods and apparatuses for memory modeling using a structural primitive verification for memory compilersALEKSANYAN KAREN·Filed 2008·Granted Feb 7, 2012·12 cites·17 claims
- 0473US10115477B2FinFET-based memory testing using multiple read operationsSYNOPSYS INC·Filed 2017·Granted Oct 30, 2018·3 cites·8 claims
- 0564US8850277B2Detecting random telegraph noise induced failures in an electronic memoryAMIRKHANYAN KAREN·Filed 2011·Granted Sep 30, 2014·4 cites·33 claims
- 0660US9514258B2Generation of memory structural model based on memory layoutAMIRKHANYAN KAREN·Filed 2012·Granted Dec 6, 2016·2 cites·21 claims
- 0758US12002530B2Embedded memory transparent in-system built-in self-testSYNOPSYS INC·Filed 2022·Granted Jun 4, 2024·0 cites·20 claims
- 0844US10192635B1FinFET-based memory testing using multiple read operationsSYNOPSYS INC·Filed 2018·Granted Jan 29, 2019·0 cites·20 claims
- 0944US9831000B2Testing electronic memories based on fault and test algorithm periodicitySYNOPSYS INC·Filed 2014·Granted Nov 28, 2017·0 cites·21 claims
- 1038US2013019130A1Testing electronic memories based on fault and test algorithm periodicitySYNOPSYS INC·Filed 2011·Application pending·0 cites
- 1135US10789398B2Method and apparatus for SOC with optimal RSMASYNOPSYS INC·Filed 2017·Granted Sep 29, 2020·0 cites·4 claims
- 1234US9053050B2Determining a desirable number of segments for a multi-segment single error correcting coding schemeGRIGORYAN HAYK·Filed 2011·Granted Jun 9, 2015·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →