Inventor · disambiguated record
Sassan Tabatabaei
Also filed as: TABATABAEI SASSAN
46 granted patents·1 pending application·433 citations·filing 2002–2024
98Inventor score
Top patents by PatentIndex Score
47 records- 0199US7653849B1Input-output device testing including embedded testsVIRAGE LOGIC CORP·Filed 2006·Granted Jan 26, 2010·59 cites·21 claims
- 0296US7598726B1Methods and apparatuses for test methodology of input-output circuitsVIRAGE LOGIC CORP·Filed 2006·Granted Oct 6, 2009·26 cites·24 claims
- 0396US7590902B1Methods and apparatuses for external delay test of input-output circuitsVIRAGE LOGIC CORP·Filed 2006·Granted Sep 15, 2009·25 cites·21 claims
- 0495US11228302B1Clock generator with dual-path temperature compensationSITIME CORP·Filed 2021·Granted Jan 18, 2022·3 cites·30 claims
- 0595US10979031B1Clock generator with dual-path temperature compensationSITIME CORP·Filed 2020·Granted Apr 13, 2021·4 cites·20 claims
- 0695US7779319B1Input-output device testing including delay testsVIRAGE LOGIC CORP·Filed 2006·Granted Aug 17, 2010·20 cites·22 claims
- 0795US7292947B1System and method of estimating phase noise based on measurement of phase jitter at multiple sampling frequenciesGUIDE TECHNOLOGY INC·Filed 2006·Granted Nov 6, 2007·33 cites·50 claims
- 0894US11005422B1Low allan-deviation oscillatorSITIME CORP·Filed 2020·Granted May 11, 2021·3 cites·22 claims
- 0994US10594301B1Clock generator with dual-path temperature compensationSITIME CORP·Filed 2018·Granted Mar 17, 2020·9 cites·21 claims
- 1094US10247621B1High resolution temperature sensorSITIME CORP·Filed 2016·Granted Apr 2, 2019·20 cites·18 claims
- 1193US11528014B1Clock generator with dual-path temperature compensationSITIME CORP·Filed 2021·Granted Dec 13, 2022·2 cites·20 claims
- 1293US11323071B1Low Allan-Deviation oscillatorSITIME CORP·Filed 2021·Granted May 3, 2022·2 cites·23 claims
- 1392US11218984B1Fixed-beacon time transfer systemSITIME CORP·Filed 2019·Granted Jan 4, 2022·6 cites·18 claims
- 1492US10833632B1Temperature-reporting oscillatorSITIME CORP·Filed 2019·Granted Nov 10, 2020·3 cites·30 claims
- 1590US7616036B1Programmable strobe and clock generatorVIRAGE LOGIC CORP·Filed 2006·Granted Nov 10, 2009·11 cites·21 claims
- 1689US10622945B1Low Allan-Deviation oscillatorSITIME CORP·Filed 2018·Granted Apr 14, 2020·4 cites·21 claims
- 1789US8225156B1Methods and apparatuses for external voltage test methodology of input-output circuitsTABATABAEI SASSAN·Filed 2010·Granted Jul 17, 2012·5 cites·20 claims
- 1889US6754613B2High resolution time-to-digital converterVECTOR 12 CORP·Filed 2002·Granted Jun 22, 2004·82 cites·115 claims
- 1988US8032806B1Input-output device testing including initializing and leakage testing input-output devicesSYNOPSYS INC·Filed 2006·Granted Oct 4, 2011·9 cites·19 claims
- 2087US11245361B1Temperature-reporting oscillatorSITIME CORP·Filed 2020·Granted Feb 8, 2022·1 cites·25 claims
- 2187US10622973B1Temperature sensor based on ratio of clock signals from respective MEMS resonatorsSITIME CORP·Filed 2019·Granted Apr 14, 2020·5 cites·20 claims
- 2286US12224709B1Cascaded oscillator designsSITIME CORP·Filed 2023·Granted Feb 11, 2025·0 cites·31 claims
- 2386US7400988B2Periodic jitter (PJ) measurement methodologyGUIDE TECHNOLOGY INC·Filed 2005·Granted Jul 15, 2008·11 cites·9 claims
- 2484US12166453B1Low Allan-deviation oscillatorSITIME CORP·Filed 2023·Granted Dec 10, 2024·0 cites·20 claims
- 2583US12294371B1Clock generator with dual-path temperature compensationSITIME CORP·Filed 2024·Granted May 6, 2025·0 cites·20 claims
- 2681US7519888B2Input-output device testingVIRAGE LOGIC CORP·Filed 2006·Granted Apr 14, 2009·10 cites·21 claims
- 2779US12101062B1Temperature-reporting oscillatorSITIME CORP·Filed 2023·Granted Sep 24, 2024·0 cites·20 claims
- 2879US12047071B1Clock generator with dual-path temperature compensationSITIME CORP·Filed 2023·Granted Jul 23, 2024·0 cites·20 claims
- 2979US11646698B1Temperature-reporting oscillatorSITIME CORP·Filed 2021·Granted May 9, 2023·0 cites·20 claims
- 3079US7203610B2System and method of obtaining data-dependent jitter (DDJ) estimates from measured signal dataGUIDE TECHNOLOGY INC·Filed 2004·Granted Apr 10, 2007·26 cites·49 claims
- 3178US7164999B2Data-dependent jitter (DDJ) calibration methodologyGUIDE TECHNOLOGY INC·Filed 2005·Granted Jan 16, 2007·10 cites·16 claims
- 3277US11716055B1Low allan-deviation oscillatorSITIME CORP·Filed 2022·Granted Aug 1, 2023·0 cites·20 claims
- 3377US7941287B2Periodic jitter (PJ) measurement methodologyTABATABAEI SASSAN·Filed 2008·Granted May 10, 2011·6 cites·3 claims
- 3477US7856581B1Methods and apparatuses for external test methodology and initialization of input-output circuitsSYNOPSYS INC·Filed 2006·Granted Dec 21, 2010·4 cites·29 claims
- 3576US11791802B1Clock generator with dual-path temperature compensationSITIME CORP·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 3675US8064293B2High resolution time interpolatorTABATABAEI SASSAN·Filed 2010·Granted Nov 22, 2011·3 cites·7 claims
- 3775US7623977B2Periodic jitter (PJ) measurement methodologyGUIDE TECHNOLOGY INC·Filed 2008·Granted Nov 24, 2009·4 cites·6 claims
- 3873US8032805B1Input-output device testing including voltage testsSYNOPSYS INC·Filed 2006·Granted Oct 4, 2011·3 cites·20 claims
- 3968US7844022B2Jitter spectrum analysis using random sampling (RS)GUIDE TECHNOLOGY INC·Filed 2006·Granted Nov 30, 2010·3 cites·15 claims
- 4067US11871369B1Time module apparatus for use with fixed-beacon time transfer systemSITIME CORP·Filed 2021·Granted Jan 9, 2024·0 cites·17 claims
- 4163US11990908B1Dual-MEMS device with temperature correction of MEMS output based on relative MEMS operationSITIME CORP·Filed 2020·Granted May 21, 2024·0 cites·17 claims
- 4260US7853847B1Methods and apparatuses for external voltage test of input-output circuitsSYNOPSYS INC·Filed 2006·Granted Dec 14, 2010·1 cites·20 claims
- 4358US7239969B2System and method of generating test signals with injected data-dependent jitter (DDJ)GUIDE TECHNOLOGY INC·Filed 2004·Granted Jul 3, 2007·9 cites·18 claims
- 4455US8255188B2Fast low frequency jitter rejection methodologyTABATABAEI SASSAN·Filed 2008·Granted Aug 28, 2012·2 cites·18 claims
- 4554US7843771B2High resolution time interpolatorGUIDE TECHNOLOGY INC·Filed 2007·Granted Nov 30, 2010·2 cites·13 claims
- 4652US7512196B2System and method of obtaining random jitter estimates from measured signal dataGUIDETECH INC·Filed 2004·Granted Mar 31, 2009·7 cites·27 claims
- 4740US2003076181A1Tunable oscillators and signal generation methodsFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →