Inventor · disambiguated record
Sadami Takeoka
Also filed as: TAKEOKA SADAMI
23 granted patents·5 pending applications·307 citations·filing 1992–2009
96Inventor score
Top patents by PatentIndex Score
28 records- 0193US7613972B2Semiconductor integrated circuit, and designing method and testing method thereofPANASONIC CORP·Filed 2006·Granted Nov 3, 2009·26 cites·17 claims
- 0289US6734549B2Semiconductor device having a device for testing the semiconductorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted May 11, 2004·39 cites·16 claims
- 0388US6625784B1Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 23, 2003·46 cites·14 claims
- 0486US6799292B2Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Sep 28, 2004·40 cites·6 claims
- 0580US7590908B2Semiconductor integrated circuit and method for testing the samePANASONIC CORP·Filed 2009·Granted Sep 15, 2009·9 cites·20 claims
- 0677US7610533B2Semiconductor integrated circuit and method for testing the samePANASONIC CORP·Filed 2005·Granted Oct 27, 2009·8 cites·23 claims
- 0777US5430736AMethod and apparatus for generating test pattern for sequential logic circuit of integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Jul 4, 1995·41 cites·28 claims
- 0875US7032196B2Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Apr 18, 2006·15 cites·6 claims
- 0966US7197725B2Semiconductor integrated circuit and testing method for the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Mar 27, 2007·13 cites·19 claims
- 1059US6615389B1Database for designing integrated circuit device, and method for designing integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 2, 2003·6 cites·16 claims
- 1156US6427218B2Method of generating test pattern for semiconductor integrated circuit and method of testing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Jul 30, 2002·7 cites·3 claims
- 1255US7348595B2Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Mar 25, 2008·4 cites·6 claims
- 1355US7171600B2Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jan 30, 2007·4 cites·4 claims
- 1455US6499125B1Method for inserting test circuit and method for converting test dataMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Dec 24, 2002·18 cites·14 claims
- 1553US7017135B2Method of designing semiconductor integrated circuit utilizing a scan test functionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Mar 21, 2006·4 cites·4 claims
- 1651US2007106965A1Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 1747US2009106721A1Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-outPANASONIC CORP·Filed 2008·Application pending·0 cites
- 1846US7203913B2Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Apr 10, 2007·2 cites·6 claims
- 1944US7302658B2Methods for evaluating quality of test sequences for delay faults and related technologyMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Nov 27, 2007·2 cites·18 claims
- 2044US2004139376A1Functional block for integrated circuit, semiconductor integrated circuit, method for testing semiconductor integrated circuit, and method for designing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 2143US7475378B2Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-outPANASONIC CORP·Filed 2005·Granted Jan 6, 2009·0 cites·1 claims
- 2242US6271677B1Semiconductor integrated circuit and method for testing the semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Aug 7, 2001·2 cites·27 claims
- 2339US6708301B1Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method thereforMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Mar 16, 2004·12 cites·10 claims
- 2439US2007250284A1Semiconductor integrated circuit and testing method for the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 2538US6282506B1Method of designing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Aug 28, 2001·5 cites·9 claims
- 2637US7159143B2Method for evaluating delay test qualityMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jan 2, 2007·0 cites·20 claims
- 2735US6205566B1Semiconductor integrated circuit, method for designing the same, and storage medium where design program for semiconductor integrated circuit is storedMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Mar 20, 2001·4 cites·28 claims
- 2835US2007038908A1Design data structure for semiconductor integrated circuit and apparatus and method for designing the sameHIRANO YOKO·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →