Inventor · disambiguated record
Sai Gautham Thoppa
Also filed as: THOPPA SAI GAUTHAM
9 granted patents·1 pending application·0 citations·filing 2022–2023
73Inventor score
Top patents by PatentIndex Score
10 records- 0159US12475959B2Non-volatile memory with current detection circuitSANDISK TECHNOLOGIES INC·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 0258US12482532B2Non-volatile memory with adjustable ramp rateSANDISK TECHNOLOGIES INC·Filed 2023·Granted Nov 25, 2025·0 cites·20 claims
- 0353US12353275B2Optimized erratic program detection processWESTERN DIGITAL TECH INC·Filed 2023·Granted Jul 8, 2025·0 cites·17 claims
- 0452US12287708B2Automatic XOR data programming by memory die for uncorrectable page failure recoveryWESTERN DIGITAL TECH INC·Filed 2023·Granted Apr 29, 2025·0 cites·20 claims
- 0551US12437831B2Non-volatile memory with slow voltage ramp compensationSANDISK TECHNOLOGIES INC·Filed 2023·Granted Oct 7, 2025·0 cites·14 claims
- 0651US12346578B2Distributed temperature sensing scheme to suppress peak Icc in non-volatile memoriesWESTERN DIGITAL TECH INC·Filed 2023·Granted Jul 1, 2025·0 cites·20 claims
- 0751US11955182B2Adaptive pre-programmingSANDISK TECHNOLOGIES LLC·Filed 2022·Granted Apr 9, 2024·0 cites·20 claims
- 0850US12272417B2Vera detection method to catch erase failSANDISK TECHNOLOGIES LLC·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
- 0948US2025157541A1Dynamic program performance modulation in a memory deviceWESTERN DIGITAL TECH INC·Filed 2023·Application pending·0 cites
- 1046US12380960B2Non-volatile memory with faster post-erase defect testingSANDISK TECHNOLOGIES LLC·Filed 2023·Granted Aug 5, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →