Inventor · disambiguated record
Satoru Toyooka
Also filed as: TOYOOKA SATORU
1 granted patent·2 pending applications·8 citations·filing 2001–2003
32Inventor score
Top patents by PatentIndex Score
3 records- 0142US6943870B2Deformation measuring method and apparatus using electronic speckle pattern interferometryPRESIDENT OF SAITAMA UNIVERSIT·Filed 2003·Granted Sep 13, 2005·8 cites·8 claims
- 0220US2004059526A1Deformation measuring method and apparatus using electronic speckle pattern interferometryPRESIDENT OF SAITAMA UNIVERSIT·Filed 2003·Application pending·0 cites
- 0320US2001052977A1Imaging spectral deviceUNIV SAITAMA·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →