Inventor · disambiguated record
Scott Luning
Also filed as: LUNING SCOTT · LUNING SCOTT D
97 granted patents·10 pending applications·3,028 citations·filing 1994–2018
99Inventor score
Top patents by PatentIndex Score
107 records- 0199US6972478B1Integrated circuit and method for its manufactureADVANCED MICRO DEVICES INC·Filed 2005·Granted Dec 6, 2005·645 cites·21 claims
- 0295US6351013B1Low-K sub spacer pocket formation for gate capacitance reductionADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 26, 2002·245 cites·6 claims
- 0395US5614765ASelf aligned via dual damasceneADVANCED MICRO DEVICES INC·Filed 1995·Granted Mar 25, 1997·172 cites·10 claims
- 0494US7504301B2Stressed field effect transistor and methods for its fabricationADVANCED MICRO DEVICES INC·Filed 2006·Granted Mar 17, 2009·22 cites·13 claims
- 0594US7138320B2Advanced technique for forming a transistor having raised drain and source regionsADVANCED MICRO DEVICES INC·Filed 2004·Granted Nov 21, 2006·82 cites·12 claims
- 0694US5705430ADual damascene with a sacrificial via fillADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 6, 1998·173 cites·16 claims
- 0793US6506642B1Removable spacer techniqueADVANCED MICRO DEVICES INC·Filed 2001·Granted Jan 14, 2003·74 cites·19 claims
- 0893US6482726B1Control trimming of hard mask for sub-100 nanometer transistor gateADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 19, 2002·85 cites·20 claims
- 0992US9219078B2Simplified multi-threshold voltage scheme for fully depleted SOI MOSFETsIBM·Filed 2013·Granted Dec 22, 2015·11 cites·15 claims
- 1091US5795823ASelf aligned via dual damasceneADVANCED MICRO DEVICES INC·Filed 1996·Granted Aug 18, 1998·114 cites·20 claims
- 1190US7553732B1Integration scheme for constrained SEG growth on poly during raised S/D processingADVANCED MICRO DEVICES INC·Filed 2005·Granted Jun 30, 2009·13 cites·20 claims
- 1290US5989963AMethod for obtaining a steep retrograde channel profileADVANCED MICRO DEVICES INC·Filed 1997·Granted Nov 23, 1999·145 cites·6 claims
- 1389US8912603B2Semiconductor device with stressed fin sectionsLUNING SCOTT·Filed 2011·Granted Dec 16, 2014·11 cites·20 claims
- 1489US6589847B1Tilted counter-doped implant to sharpen halo profileADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 8, 2003·47 cites·80 claims
- 1588US8404592B2Methods for fabricating FinFET semiconductor devices using L-shaped spacersLUNING SCOTT·Filed 2009·Granted Mar 26, 2013·14 cites·14 claims
- 1687US6372587B1Angled halo implant tailoring using implant maskADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 16, 2002·39 cites·20 claims
- 1786US8120120B2Embedded silicon germanium source drain structure with reduced silicide encroachment and contact resistance and enhanced channel mobilityYANG FRANK BIN·Filed 2009·Granted Feb 21, 2012·16 cites·18 claims
- 1885US8039349B2Methods for fabricating non-planar semiconductor devices having stress memoryGLOBALFOUNDRIES INC·Filed 2009·Granted Oct 18, 2011·9 cites·4 claims
- 1985US7977174B2FinFET structures with stress-inducing source/drain-forming spacers and methods for fabricating the sameGLOBALFOUNDRIES INC·Filed 2009·Granted Jul 12, 2011·11 cites·20 claims
- 2085US7960229B2Metal oxide semiconductor transistor with reduced gate height, and related fabrication methodsGLOBALFOUNDRIES INC·Filed 2008·Granted Jun 14, 2011·10 cites·10 claims
- 2184US10068806B2Method, apparatus, and system for using a cover mask for enabling metal line jumping over MOL features in a standard cellGLOBALFOUNDRIES INC·Filed 2018·Granted Sep 4, 2018·3 cites·10 claims
- 2284US7442601B2Stress enhanced CMOS circuits and methods for their fabricationADVANCED MICRO DEVICES INC·Filed 2006·Granted Oct 28, 2008·10 cites·18 claims
- 2384US6787464B1Method of forming silicide layers over a plurality of semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 7, 2004·32 cites·13 claims
- 2484US5691238ASubtractive dual damasceneADVANCED MICRO DEVICES INC·Filed 1995·Granted Nov 25, 1997·68 cites·19 claims
- 2584US5686354ADual damascene with a protective mask for via etchingADVANCED MICRO DEVICES INC·Filed 1995·Granted Nov 11, 1997·80 cites·11 claims
- 2683US9947590B1Method, apparatus, and system for using a cover mask for enabling metal line jumping over MOL features in a standard cellGLOBALFOUNDRIES INC·Filed 2016·Granted Apr 17, 2018·3 cites·13 claims
- 2783US7176110B2Technique for forming transistors having raised drain and source regions with different heightsADVANCED MICRO DEVICES INC·Filed 2004·Granted Feb 13, 2007·32 cites·4 claims
- 2882US7910996B2Semiconductor device and method of manufacturing a semiconductor deviceGLOBALFOUNDRIES INC·Filed 2009·Granted Mar 22, 2011·7 cites·20 claims
- 2982US7402485B1Method of forming a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2005·Granted Jul 22, 2008·9 cites·16 claims
- 3082US6180468B1Very low thermal budget channel implant process for semiconductorsADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 30, 2001·48 cites·18 claims
- 3181US8030144B2Semiconductor device with stressed fin sections, and related fabrication methodsGLOBALFOUNDRIES INC·Filed 2009·Granted Oct 4, 2011·7 cites·17 claims
- 3280US7241700B1Methods for post offset spacer clean for improved selective epitaxy silicon growthADVANCED MICRO DEVICES INC·Filed 2004·Granted Jul 10, 2007·22 cites·24 claims
- 3379US10262905B2Simplified multi-threshold voltage scheme for fully depleted SOI MOSFETsIBM·Filed 2015·Granted Apr 16, 2019·2 cites·16 claims
- 3479US6107149ACMOS semiconductor device comprising graded junctions with reduced junction capacitanceADVANCED MICRO DEVICES INC·Filed 1999·Granted Aug 22, 2000·51 cites·13 claims
- 3579US6051473AFabrication of raised source-drain transistor devicesADVANCED MICRO DEVICES INC·Filed 1996·Granted Apr 18, 2000·45 cites·9 claims
- 3679US5482881AMethod of making flash EEPROM memory with reduced column leakage currentADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 9, 1996·37 cites·23 claims
- 3778US7572705B1Semiconductor device and method of manufacturing a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2005·Granted Aug 11, 2009·6 cites·12 claims
- 3877US6949436B2Composite spacer liner for improved transistor performanceADVANCED MICRO DEVICES INC·Filed 2004·Granted Sep 27, 2005·19 cites·8 claims
- 3977US5888867ANon-uniform threshold voltage adjustment in flash eproms through gate work function alterationADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 30, 1999·49 cites·14 claims
- 4076US7829401B2MOSFET with asymmetrical extension implantADVANCED MICRO DEVICES INC·Filed 2008·Granted Nov 9, 2010·5 cites·11 claims
- 4176US5770519ACopper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1995·Granted Jun 23, 1998·49 cites·19 claims
- 4275US6743685B1Semiconductor device and method for lowering miller capacitance for high-speed microprocessorsADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 1, 2004·16 cites·21 claims
- 4374US6391751B1Method for forming vertical profile of polysilicon gate electrodesADVANCED MICRO DEVICES INC·Filed 2000·Granted May 21, 2002·23 cites·14 claims
- 4471US9029956B2SRAM cell with individual electrical device threshold controlMANN RANDY W·Filed 2011·Granted May 12, 2015·3 cites·19 claims
- 4571US5650343ASelf-aligned implant energy modulation for shallow source drain extension formationADVANCED MICRO DEVICES INC·Filed 1995·Granted Jul 22, 1997·41 cites·13 claims
- 4669US6806126B1Method of manufacturing a semiconductor componentADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 19, 2004·12 cites·25 claims
- 4769US6232166B1CMOS processing employing zero degree halo implant for P-channel transistorADVANCED MICRO DEVICES INC·Filed 1998·Granted May 15, 2001·28 cites·18 claims
- 4868US7674720B2Stacking fault reduction in epitaxially grown siliconIBM·Filed 2008·Granted Mar 9, 2010·2 cites·15 claims
- 4967US5652447AFlash EEPROM memory with reduced column leakage currentADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 29, 1997·22 cites·3 claims
- 5065US6777281B1Maintaining LDD series resistance of MOS transistors by retarding dopant segregationADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 17, 2004·9 cites·15 claims
Showing the top 50 of 107 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →