Inventor · disambiguated record
Seiji Isogai
Also filed as: ISOGAI SEIJI
18 granted patents·2 pending applications·434 citations·filing 1997–2015
95Inventor score
Top patents by PatentIndex Score
20 records- 0191US7113628B1Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatusHITACHI LTD·Filed 2000·Granted Sep 26, 2006·54 cites·3 claims
- 0289US6476388B1Scanning electron microscope having magnification switching controlHITACHI LTD·Filed 1999·Granted Nov 5, 2002·95 cites·9 claims
- 0388US6792359B2Method for inspecting defect and system thereforHITACHI LTD·Filed 2001·Granted Sep 14, 2004·29 cites·16 claims
- 0487US6542830B1Process control systemHITACHI LTD·Filed 1997·Granted Apr 1, 2003·93 cites·25 claims
- 0584US7062081B2Method and system for analyzing circuit pattern defectsHITACHI LTD·Filed 2001·Granted Jun 13, 2006·31 cites·11 claims
- 0683US7307254B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2005·Granted Dec 11, 2007·7 cites·8 claims
- 0783US6757621B2Process management systemHITACHI LTD·Filed 2003·Granted Jun 29, 2004·35 cites·10 claims
- 0877US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 0972US8428336B2Inspecting method, inspecting system, and method for manufacturing electronic devicesIKEDA YOKO·Filed 2006·Granted Apr 23, 2013·7 cites·13 claims
- 1070US7352890B2Method for analyzing circuit pattern defects and a system thereofHITACHI LTD·Filed 2006·Granted Apr 1, 2008·3 cites·7 claims
- 1167US7307253B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2005·Granted Dec 11, 2007·1 cites·10 claims
- 1264US7010447B2Method for inspecting defect and system thereforHITACHI LTD·Filed 2004·Granted Mar 7, 2006·6 cites·2 claims
- 1362US7068834B1Inspecting method, inspecting system, and method for manufacturing electronic devicesHITACHI LTD·Filed 1999·Granted Jun 27, 2006·35 cites·34 claims
- 1462US6756589B1Method for observing specimen and device thereforHITACHI LTD·Filed 1999·Granted Jun 29, 2004·29 cites·10 claims
- 1557US7558683B2Method for inspecting defect and system thereforHITACHI LTD·Filed 2007·Granted Jul 7, 2009·0 cites·4 claims
- 1653US7305314B2Method for inspecting defect and system thereforHITACHI LTD·Filed 2005·Granted Dec 4, 2007·0 cites·4 claims
- 1749US2008187212A1Defect Image Classifying Method and Apparatus and a Semiconductor Device Manufacturing Process Based on the Method and ApparatusHITACHI LTD·Filed 2008·Application pending·0 cites
- 1848US7356177B2Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatusHITACHI LTD·Filed 2006·Granted Apr 8, 2008·0 cites·3 claims
- 1945US6978041B2Review work supporting systemHITACHI LTD·Filed 2002·Granted Dec 20, 2005·2 cites·4 claims
- 2038US2018209924A1Defect Determining Method and X-Ray Inspection DeviceHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →