Inventor · disambiguated record
Seigo Kishino
Also filed as: KISHINO SEIGO
5 granted patents·327 citations·filing 1974–2003
83Inventor score
Top patents by PatentIndex Score
5 records- 0194US4314595AMethod of forming nondefective zone in silicon single crystal wafer by two stage-heat treatmentVLSI TECHNOLOGY RES ASS·Filed 1980·Granted Feb 9, 1982·179 cites·13 claims
- 0291US4376657AMethod of making fault-free surface zone in semiconductor devices by step-wise heat treatingVLSI TECHNOLOGY RES ASS·Filed 1980·Granted Mar 15, 1983·107 cites·9 claims
- 0374US4378269AMethod of manufacturing a single crystal silicon rodVLSI TECHNOLOGY RES ASS·Filed 1981·Granted Mar 29, 1983·18 cites·2 claims
- 0469US3951729AMethod for producing single crystalsHITACHI LTD·Filed 1974·Granted Apr 20, 1976·23 cites·16 claims
- 0534US7126194B2Method for removing impurities of a semiconductor wafer, semiconductor wafer assembly, and semiconductor deviceJAPAN SOC PROMOTION MACH IND·Filed 2003·Granted Oct 24, 2006·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →