Inventor · disambiguated record
Seigo Murakami
Also filed as: MURAKAMI SEIGO
11 granted patents·2 pending applications·43 citations·filing 2001–2025
85Inventor score
Top patents by PatentIndex Score
13 records- 0178US8137537B2Filtered water monitoring device and filtered water monitoring systemHIRATA YUICHIRO·Filed 2006·Granted Mar 20, 2012·12 cites·12 claims
- 0278US2025327723A1Sample producing apparatusHIRATA SPINNING·Filed 2025·Application pending·0 cites
- 0377US9423325B2Block storage device and automatic thin-cutting deviceSAKURA FINETEK JAPAN CO LTD·Filed 2013·Granted Aug 23, 2016·4 cites·5 claims
- 0472US12379292B2Sample producing apparatusHIRATA SPINNING·Filed 2022·Granted Aug 5, 2025·0 cites·20 claims
- 0571US6802099B2Cleaning member and cylindrical cleaning elementEBARA CORP·Filed 2001·Granted Oct 12, 2004·18 cites·5 claims
- 0664US12392688B2Sample producing apparatusHIRATA SPINNING·Filed 2022·Granted Aug 19, 2025·0 cites·22 claims
- 0758US2025303196A1Ultrasonic therapy device, fluid operation device, and fluid circuit setHIRATA SPINNING·Filed 2023·Application pending·0 cites
- 0854USD604343SSample crushing and pulverizing apparatusHIRATA SPINNING·Filed 2009·Granted Nov 17, 2009·9 cites·1 claims
- 0950US12013319B2Sample producing methodHIRATA SPINNING·Filed 2021·Granted Jun 18, 2024·0 cites·9 claims
- 1050US11549869B2Specimen preparation method and specimen preparation deviceHIRATA SPINNING·Filed 2019·Granted Jan 10, 2023·0 cites·7 claims
- 1146US9983100B2Thin section preparation deviceSAKURA FINETEK JAPAN CO LTD·Filed 2013·Granted May 29, 2018·0 cites·3 claims
- 1245US9611104B2Sorting apparatus and vessel sorting methodHIRATA SPINNING·Filed 2012·Granted Apr 4, 2017·0 cites·7 claims
- 1338US8142660B2Filtrate monitoring device, and filtrate monitoring systemMURAKAMI SEIGO·Filed 2007·Granted Mar 27, 2012·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Seigo Murakami files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →