Inventor · disambiguated record
Seiko Omori
Also filed as: OMORI SEIKO
3 granted patents·1 pending application·7 citations·filing 2007–2011
60Inventor score
Top patents by PatentIndex Score
4 records- 0170US9110384B2Scanning electron microscopeOMORI SEIKO·Filed 2011·Granted Aug 18, 2015·3 cites·8 claims
- 0265US7928384B2Localized static charge distribution precision measurement method and deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 19, 2011·2 cites·8 claims
- 0361US8309923B2Sample observing method and scanning electron microscopeOMORI SEIKO·Filed 2010·Granted Nov 13, 2012·2 cites·11 claims
- 0442US2008017797A1Pattern inspection and measurement apparatusCHENG ZHAOHUI·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →