Inventor · disambiguated record
Seung-Man Shin
Also filed as: SHIN SEUNG-MAN
13 granted patents·6 pending applications·65 citations·filing 2004–2013
89Inventor score
Top patents by PatentIndex Score
19 records- 0187US7343533B2Hub for testing memory and methods thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 11, 2008·20 cites·22 claims
- 0283US7519873B2Methods and apparatus for interfacing between test system and memorySAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 14, 2009·13 cites·25 claims
- 0379US7487413B2Memory module testing apparatus and method of testing memory modulesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 3, 2009·7 cites·25 claims
- 0477US7447954B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 4, 2008·8 cites·19 claims
- 0576US7849373B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Dec 7, 2010·2 cites·10 claims
- 0670US7874924B2Tripod type constant velocity jointHYUNDAI WIA CORP·Filed 2007·Granted Jan 25, 2011·4 cites·9 claims
- 0764US8051343B2Method of testing a memory module and hub of the memory moduleSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Nov 1, 2011·2 cites·15 claims
- 0861US7606110B2Memory module, memory unit, and hub with non-periodic clock and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 20, 2009·5 cites·20 claims
- 0944US7539910B2Memory module test system for memory module including hubSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 26, 2009·4 cites·11 claims
- 1044US2005289287A1Method and apparatus for interfacing between test system and embedded memory on test mode setting operationSHIN SEUNG-MAN·Filed 2005·Application pending·0 cites
- 1141US2012191964A1Methods of booting information handling systems and information handling systems performing the sameLEE JONG-MIN·Filed 2011·Application pending·0 cites
- 1239US9298612B2Semiconductor memory device and computer system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Mar 29, 2016·0 cites·18 claims
- 1339US7233157B2Test board for high-frequency system level testSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 19, 2007·0 cites·20 claims
- 1436US8976615B2Semiconductor memory device capable of performing refresh operation without auto refresh commandSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Mar 10, 2015·0 cites·19 claims
- 1532US2007030814A1Memory module and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1632US2006064611A1Method of testing memory module and memory moduleSHIN SEUNG-MAN·Filed 2005·Application pending·0 cites
- 1731US8298092B2Tripod type constant velocity jointCHO JEONG HYUN·Filed 2010·Granted Oct 30, 2012·0 cites·16 claims
- 1830US2011001467A1Method optimizing driving voltage and electronic systemSAMSUNG ELECTRONICS CO LTD·Filed 2010·Application pending·0 cites
- 1929US2006095817A1Buffer for testing a memory module and method thereofLEE KEE-HOON·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →