Inventor · disambiguated record
Sergey Starik
Also filed as: STARIK SERGEY
10 granted patents·1 pending application·79 citations·filing 2013–2023
88Inventor score
Top patents by PatentIndex Score
11 records- 0197US9157730B2PECVD processAPPLIED MATERIALS INC·Filed 2013·Granted Oct 13, 2015·49 cites·18 claims
- 0296US9458537B2PECVD processAPPLIED MATERIALS INC·Filed 2015·Granted Oct 4, 2016·12 cites·20 claims
- 0395US9816187B2PECVD processAPPLIED MATERIALS INC·Filed 2016·Granted Nov 14, 2017·8 cites·20 claims
- 0493US11613812B2PECVD processAPPLIED MATERIALS INC·Filed 2020·Granted Mar 28, 2023·2 cites·20 claims
- 0590US10793954B2PECVD processAPPLIED MATERIALS INC·Filed 2018·Granted Oct 6, 2020·3 cites·13 claims
- 0690US10060032B2PECVD processAPPLIED MATERIALS INC·Filed 2017·Granted Aug 28, 2018·3 cites·20 claims
- 0785US11898249B2PECVD processAPPLIED MATERIALS INC·Filed 2023·Granted Feb 13, 2024·0 cites·17 claims
- 0873US10030306B2PECVD apparatus and processAPPLIED MATERIALS INC·Filed 2013·Granted Jul 24, 2018·1 cites·16 claims
- 0963US9490154B2Method of aligning substrate-scale mask with substrateAPPLIED MATERIALS INC·Filed 2015·Granted Nov 8, 2016·1 cites·8 claims
- 1049US12062583B2Optical metrology models for in-line film thickness measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Aug 13, 2024·0 cites·19 claims
- 1142US2015203966A1Measurement of film thickness on an arbitrary substrateAPPLIED MATERIALS INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →