Inventor · disambiguated record
Shayak Banerjee
Also filed as: BANERJEE SHAYAK
36 granted patents·5 pending applications·379 citations·filing 2008–2024
97Inventor score
Files withIBM12AGARWAL KANAK B9THE JOAN AND IRWIN JACOBS TECHNION-CORNELL INNOVATION INST5BANERJEE SHAYAK3DUMONT EMMANUEL3
Top patents by PatentIndex Score
41 records- 0197US8647893B1Method for post decomposition density balancing in integrated circuit layouts, related system and program productAGARWAL KANAK B·Filed 2012·Granted Feb 11, 2014·34 cites·20 claims
- 0297US8103983B2Electrically-driven optical proximity correction to compensate for non-optical effectsAGARWAL KANAK B·Filed 2008·Granted Jan 24, 2012·104 cites·20 claims
- 0396US8464194B1Machine learning approach to correct lithographic hot-spotsAGARWAL KANAK BEHARI·Filed 2011·Granted Jun 11, 2013·26 cites·20 claims
- 0495US8689151B1Pitch-aware multi-patterning lithographyAGARWAL KANAK BEHARI·Filed 2012·Granted Apr 1, 2014·17 cites·20 claims
- 0595US8627245B1Density balancing in multiple patterning lithography using integrated circuit layout fillBANERJEE SHAYAK·Filed 2012·Granted Jan 7, 2014·19 cites·17 claims
- 0695US8612902B1Retargeting multiple patterned integrated circuit device designsIBM·Filed 2012·Granted Dec 17, 2013·21 cites·19 claims
- 0794US8146026B2Simultaneous photolithographic mask and target optimizationAGARWAL KANAK B·Filed 2009·Granted Mar 27, 2012·18 cites·20 claims
- 0893US10527490B2Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposureTHE JOAN AND IRWIN JACOBS TECHNION CORNELL INNOVATION INST·Filed 2016·Granted Jan 7, 2020·11 cites·16 claims
- 0992US9626459B2Detecting hotspots using machine learning on diffraction patternsIBM·Filed 2014·Granted Apr 18, 2017·21 cites·20 claims
- 1091US9880052B2Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposureTHE JOAN AND IRWIN JACOBS TECHNION-CORNELL INNOVATION INST·Filed 2016·Granted Jan 30, 2018·11 cites·6 claims
- 1191US9798458B2Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposureTHE JOAN AND IRWIN JACOBS TECHNION-CORNELL INNOVATION INST·Filed 2016·Granted Oct 24, 2017·8 cites·20 claims
- 1291US8415077B2Simultaneous optical proximity correction and decomposition for double exposure lithographyAGARWAL KANAK B·Filed 2010·Granted Apr 9, 2013·7 cites·16 claims
- 1391US8321818B2Model-based retargeting of layout patterns for sub-wavelength photolithographyAGARWAL KANAK B·Filed 2009·Granted Nov 27, 2012·13 cites·20 claims
- 1489US8627244B2Frequency domain layout decomposition in double patterning lithographyAGARWAL KANAK B·Filed 2011·Granted Jan 7, 2014·6 cites·20 claims
- 1589US8331646B2Optical proximity correction for transistors using harmonic mean of gate lengthAGARWAL KANAK B·Filed 2009·Granted Dec 11, 2012·10 cites·20 claims
- 1689US7865864B2Electrically driven optical proximity correctionIBM·Filed 2008·Granted Jan 4, 2011·22 cites·14 claims
- 1785US9880725B2Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposureTHE JOAN AND IRWIN JACOBS TECHNION-CORNELL INNOVATION INST·Filed 2017·Granted Jan 30, 2018·6 cites·20 claims
- 1884US10739253B2Methods, systems, and devices for calibrating light sensing devicesYOUV LABS INC·Filed 2017·Granted Aug 11, 2020·2 cites·8 claims
- 1979US10527491B2Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposureTHE JOAN AND IRWIN JACOBS TECHNION CORNELL INNOVATION INST·Filed 2016·Granted Jan 7, 2020·2 cites·5 claims
- 2079US10378953B2Methods for guiding personal limit selection in UV dosimetryYOUV LABS INC·Filed 2018·Granted Aug 13, 2019·2 cites·5 claims
- 2177US9311442B2Net-voltage-aware optical proximity correction (OPC)GLOBALFOUNDRIES INC·Filed 2014·Granted Apr 12, 2016·4 cites·19 claims
- 2274US10732034B2Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposureDUMONT EMMANUEL·Filed 2019·Granted Aug 4, 2020·2 cites·13 claims
- 2372US8176444B2Analyzing multiple induced systematic and statistical layout dependent effects on circuit performanceBANERJEE SHAYAK·Filed 2009·Granted May 8, 2012·5 cites·18 claims
- 2471US2024325856A1User experience personalization in a connected fitness platformPELOTON INTERACTIVE INC·Filed 2024·Application pending·0 cites
- 2568US8418087B2Analyzing multiple induced systematic and statistical layout dependent effects on circuit performanceBANERJEE SHAYAK·Filed 2012·Granted Apr 9, 2013·2 cites·10 claims
- 2661US11182531B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2019·Granted Nov 23, 2021·0 cites·20 claims
- 2760US11163934B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2019·Granted Nov 2, 2021·0 cites·15 claims
- 2857US9342648B2Optical proximity correction (OPC) accounting for critical dimension (CD) variation from inter-level effectsIBM·Filed 2014·Granted May 17, 2016·0 cites·20 claims
- 2955US9536039B2Optical proximity correction (OPC) accounting for critical dimension (CD) variation from inter-level effectsIBM·Filed 2016·Granted Jan 3, 2017·0 cites·20 claims
- 3054US10395002B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2017·Granted Aug 27, 2019·0 cites·16 claims
- 3153US10339261B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2015·Granted Jul 2, 2019·0 cites·19 claims
- 3253US9607268B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2016·Granted Mar 28, 2017·0 cites·17 claims
- 3351USD829112SSensing deviceDUMONT EMMANUEL·Filed 2016·Granted Sep 25, 2018·6 cites·1 claims
- 3450US8782573B2Solutions for retargeting integrated circuit layouts based on diffraction pattern analysisAGARWAL KANAK B·Filed 2012·Granted Jul 15, 2014·0 cites·20 claims
- 3550US2018224326A1Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposureDUMONT EMMANUEL·Filed 2018·Application pending·0 cites
- 3648US9330223B2Optical rule checking for detecting at risk structures for overlay issuesIBM·Filed 2012·Granted May 3, 2016·0 cites·17 claims
- 3747US8281263B2Propagating design tolerances to shape tolerances for lithographyAGARWAL KANAK·Filed 2009·Granted Oct 2, 2012·0 cites·20 claims
- 3847US2015185855A1Method and apparatus to continuously maintain users eyes focused on an electronic display when either one or both are movingHONG YE JIN·Filed 2014·Application pending·0 cites
- 3946US2015112649A1Clustering Lithographic Hotspots Based on Frequency Domain EncodingIBM·Filed 2013·Application pending·0 cites
- 4044US8402398B2Reducing through process delay variation in metal wiresAGARWAL KANAK B·Filed 2011·Granted Mar 19, 2013·0 cites·17 claims
- 4137US2017124489A1Non-Scheduled Chartered Transportation Reservation EnvironmentEVOLUX TRANSP LLC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →