Inventor · disambiguated record
Shinji Bessho
Also filed as: BESSHO SHINJI
22 granted patents·2 pending applications·273 citations·filing 1997–2022
95Inventor score
Files withMICRON TECHNOLOGY INC9TEXAS INSTRUMENTS INC7NITTO DENKO CORP2SUNSTAR ENGINEERING INC2HITACHI LTD1
Top patents by PatentIndex Score
24 records- 0198US11315620B2Semiconductor device performing row hammer refresh operationMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 26, 2022·13 cites·8 claims
- 0297US11935576B2Semiconductor device performing row hammer refresh operationMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 19, 2024·4 cites·20 claims
- 0392US11270750B2Semiconductor device performing row hammer refresh operationMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 8, 2022·3 cites·20 claims
- 0490US6031779ADynamic memoryHITACHI LTD·Filed 1998·Granted Feb 29, 2000·91 cites·18 claims
- 0577US7515501B2Memory architecture having local column select linesMICRON TECHNOLOGY INC·Filed 2007·Granted Apr 7, 2009·11 cites·26 claims
- 0676US6129986ALuminous composition and electroluminescent device comprising the sameSUNSTAR ENGINEERING INC·Filed 1998·Granted Oct 10, 2000·33 cites·13 claims
- 0768US5869732AProcess for producing tricyanoethylated pentaerythritolSUNSTAR ENGINEERING INC·Filed 1997·Granted Feb 9, 1999·10 cites·4 claims
- 0865US6002162AOverall VPP well formTEXAS INSTRUMENTS INC·Filed 1998·Granted Dec 14, 1999·24 cites·3 claims
- 0963US10706909B2Apparatuses and methods for refresh operations including multiple refresh activationsMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 7, 2020·1 cites·20 claims
- 1062US11011218B2Apparatuses and methods for refresh operations including multiple refresh activationsMICRON TECHNOLOGY INC·Filed 2020·Granted May 18, 2021·0 cites·20 claims
- 1160US8911648B2Reactive polymer-supported porous film for battery separator, method for producing the porous film, method for producing battery using the porous film, and electrode/porous film assemblyUETANI YOSHIHIRO·Filed 2012·Granted Dec 16, 2014·0 cites·3 claims
- 1260US6049499AShared electrical supply line for a semiconductor storage deviceTEXAS INSTRUMENTS INC·Filed 1998·Granted Apr 11, 2000·19 cites·5 claims
- 1355US6097648ASemiconductor memory device having plurality of equalizer control line driversTEXAS INSTRUMENTS INC·Filed 1998·Granted Aug 1, 2000·15 cites·8 claims
- 1454US6169698B1Voltage generating circuit for semiconductor memory sense amplifierTEXAS INSTRUMENTS INC·Filed 1998·Granted Jan 2, 2001·14 cites·10 claims
- 1554US2006099497A1Reactive polymer-supported porous film for battery separator, method for producing the porous film, method for producing battery using the porous film, and electrode/porous film assemblyNITTO DENKO CORP·Filed 2005·Application pending·0 cites
- 1653US5970010ASemiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1998·Granted Oct 19, 1999·14 cites·8 claims
- 1752US11354066B2Command filter filtering command having predetermined pulse widthMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 7, 2022·0 cites·20 claims
- 1852US8420247B2Crosslinking polymer-supported porous film for battery separator and use thereofTAKE HIROYOSHI·Filed 2008·Granted Apr 16, 2013·0 cites·13 claims
- 1952US2010325877A1Porous film having reactive polymer layer thereon for use in battery separator, and use of the porous filmNITTO DENKO CORP·Filed 2008·Application pending·0 cites
- 2043US8068379B1Dynamic RAMTAKAHASHI TSUTOMU·Filed 1998·Granted Nov 29, 2011·10 cites·14 claims
- 2141US10790004B2Apparatuses and methods for multi-bank and multi-pump refresh operationsMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 29, 2020·0 cites·20 claims
- 2240US11037616B2Apparatuses and methods for refresh operations in semiconductor memoriesMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 15, 2021·0 cites·20 claims
- 2336US6038158ASemiconductor memoryTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 14, 2000·6 cites·12 claims
- 2436US6034920ASemiconductor memory device having a back gate voltage controlled delay circuitTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 7, 2000·5 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →