Inventor · disambiguated record
Shahedul Hoque
Also filed as: HOQUE Shahedul
20 granted patents·3 pending applications·50 citations·filing 2012–2024
93Inventor score
Top patents by PatentIndex Score
23 records- 0194US11694873B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Jul 4, 2023·2 cites·8 claims
- 0292US9697987B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jul 4, 2017·9 cites·11 claims
- 0391US10872745B2Charged-particle beam systemHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 22, 2020·7 cites·9 claims
- 0491US10720306B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 21, 2020·4 cites·12 claims
- 0590US10249474B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 2, 2019·4 cites·10 claims
- 0689US8618499B1Electron beam irradiation apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 31, 2013·6 cites·5 claims
- 0788US11139144B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Oct 5, 2021·5 cites·16 claims
- 0886US11749497B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 5, 2023·1 cites·20 claims
- 0985US11515120B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 29, 2022·4 cites·13 claims
- 1085US9053905B2Electron beam irradiation apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 9, 2015·4 cites·9 claims
- 1178US11798780B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 24, 2023·0 cites·5 claims
- 1277US2025037967A1Charged particle beam apparatus with multiple detectors and methods for imagingASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1373US11239052B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 1, 2022·0 cites·3 claims
- 1473US10984981B2Charged particle beam device having inspection scan direction based on scan with smaller doseHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 20, 2021·1 cites·18 claims
- 1573US10593512B2Light guide, detector having light guide, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Mar 17, 2020·1 cites·9 claims
- 1667US12142455B2Charged particle beam apparatus with multiple detectors and methods for imagingASML NETHERLANDS BV·Filed 2021·Granted Nov 12, 2024·0 cites·15 claims
- 1767US10679821B1Light guide, detector having light guide, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 9, 2020·0 cites·9 claims
- 1863US10546715B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 28, 2020·1 cites·15 claims
- 1958US10297419B2Scanning electron microscope with charge density controlHOQUE Shahedul·Filed 2012·Granted May 21, 2019·1 cites·12 claims
- 2051US2024021404A1Charged-particle beam apparatus with beam-tilt and methods thereofASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2149US10984979B2Charged particle detector and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 20, 2021·0 cites·5 claims
- 2248US2017323763A1Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
- 2335US10755890B2Charged particle beam apparatusHITACHI HIGH-TECH CORP·Filed 2018·Granted Aug 25, 2020·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →