Inventor · disambiguated record
Sheng-Yuan Hsueh
Also filed as: HSUEH SHENG-YUAN
57 granted patents·26 pending applications·64 citations·filing 2005–2025
97Inventor score
Top patents by PatentIndex Score
83 records- 0197US11296214B2High electron mobility transistor (HEMT) and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 5, 2022·18 cites·12 claims
- 0295US10256155B1Method for fabricating single diffusion break structure directly under a gate lineUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 9, 2019·16 cites·20 claims
- 0394US12245424B2One-time programmable memory capacitor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2021·Granted Mar 4, 2025·2 cites·8 claims
- 0491US11450670B1Semiconductor memory cell and the forming method thereofUNITED MICROELECTRONICS CORP·Filed 2021·Granted Sep 20, 2022·2 cites·18 claims
- 0591US2025344430A1High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 0690US2025113523A1High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0789US12396194B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Granted Aug 19, 2025·0 cites·5 claims
- 0889US12206018B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Granted Jan 21, 2025·0 cites·5 claims
- 0989US11854632B2Semiconductor memory structure and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2021·Granted Dec 26, 2023·2 cites·20 claims
- 1089US10867999B2Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Dec 15, 2020·5 cites·20 claims
- 1189US2025107101A1Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1288US12200947B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jan 14, 2025·0 cites·7 claims
- 1388US11631761B2High electron mobility transistor (HEMT) and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2022·Granted Apr 18, 2023·1 cites·7 claims
- 1487US11316031B2Method of forming fin forced stack inverterUNITED MICROELECTRONICS CORP·Filed 2020·Granted Apr 26, 2022·2 cites·7 claims
- 1586US12150314B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2023·Granted Nov 19, 2024·0 cites·8 claims
- 1686US2025040148A1Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1784US12009415B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jun 11, 2024·0 cites·11 claims
- 1884US11973133B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Apr 30, 2024·0 cites·10 claims
- 1984US2024429228A1Resistor and resistor-transistor-logic circuit with gan structure and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2083US10566290B2Alignment mark and measurement method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Feb 18, 2020·4 cites·14 claims
- 2182US12132043B2Resistor and resistor-transistor-logic circuit with GaN structure and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Oct 29, 2024·0 cites·11 claims
- 2282US12119342B2Resistor and resistor-transistor-logic circuit with GaN structure and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Oct 15, 2024·0 cites·6 claims
- 2382US11895847B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2022·Granted Feb 6, 2024·0 cites·7 claims
- 2481US11864391B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jan 2, 2024·0 cites·1 claims
- 2580US12419060B2Data storage cell, memory, and memory fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2024·Granted Sep 16, 2025·0 cites·15 claims
- 2680US10985211B1Embedded MRAM structure and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 20, 2021·3 cites·10 claims
- 2778US12500115B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Dec 16, 2025·0 cites·10 claims
- 2876US2025014661A1Bit cell structure for one-time-programmingUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 2974US11688800B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jun 27, 2023·0 cites·8 claims
- 3074US2024074329A1Method of forming semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 3173US11705512B2High electron mobility transistor (HEMT) and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jul 18, 2023·0 cites·8 claims
- 3271US12261169B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Mar 25, 2025·0 cites·7 claims
- 3371US11631664B2Resistor and resistor-transistor-logic circuit with GaN structure and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Apr 18, 2023·0 cites·8 claims
- 3470US11532666B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2021·Granted Dec 20, 2022·0 cites·8 claims
- 3570US2025194232A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 3669US10991757B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 27, 2021·1 cites·8 claims
- 3767US11856867B2MRAM having multilayered interconnect structuresUNITED MICROELECTRONICS CORP·Filed 2020·Granted Dec 26, 2023·0 cites·10 claims
- 3867US11569295B2Magnetoresistive random access memoryUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jan 31, 2023·0 cites·9 claims
- 3967US10247774B2Test key structure and method of measuring resistance of viasUNITED MICROELECTRONICS CORP·Filed 2016·Granted Apr 2, 2019·1 cites·19 claims
- 4066US8890551B2Test key structure and method for measuring step height by such test key structureKANG CHIH-KAI·Filed 2011·Granted Nov 18, 2014·2 cites·20 claims
- 4166US2025176175A1One-time programmable memory capacitor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 4265US12477814B2Semiconductor device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Nov 18, 2025·0 cites·19 claims
- 4365US12133377B2Bit cell structure for one-time-programmingUNITED MICROELECTRONICS CORP·Filed 2021·Granted Oct 29, 2024·0 cites·8 claims
- 4465US7190044B1Fuse structure for a semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2005·Granted Mar 13, 2007·3 cites·29 claims
- 4564US12389593B2One-time programmable memory cellUNITED MICROELECTRONICS CORP·Filed 2023·Granted Aug 12, 2025·0 cites·10 claims
- 4664US11956974B2Data storage cell, memory, and memory fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2020·Granted Apr 9, 2024·0 cites·18 claims
- 4762US11605631B23D semiconductor structure and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2021·Granted Mar 14, 2023·0 cites·5 claims
- 4861US2025176197A1Metal-oxide-semiconductor capacitorUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 4960US11665891B2One-time programmable memory cell and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2021·Granted May 30, 2023·0 cites·14 claims
- 5060US11296036B2Mark pattern in semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2020·Granted Apr 5, 2022·0 cites·15 claims
Showing the top 50 of 83 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →