Inventor · disambiguated record
Sheng-Yao Huang
Also filed as: Huang sheng-yao
15 granted patents·1 pending application·27 citations·filing 2014–2024
89Inventor score
Top patents by PatentIndex Score
16 records- 0195US10714051B1Driving apparatus and driving signal generating method thereofAU OPTRONICS CORP·Filed 2019·Granted Jul 14, 2020·13 cites·20 claims
- 0287US11088285B2Oxide semiconductor field effect transistor and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 10, 2021·3 cites·11 claims
- 0387US10446689B1Manufacturing method of oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2019·Granted Oct 15, 2019·4 cites·8 claims
- 0486US11631771B2Oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 2021·Granted Apr 18, 2023·1 cites·12 claims
- 0583US12328898B2High voltage semiconductor device including buried oxide layerUNITED MICROELECTRONICS CORP·Filed 2024·Granted Jun 10, 2025·0 cites·10 claims
- 0679US12027629B2Oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jul 2, 2024·0 cites·12 claims
- 0776US12040396B2High voltage semiconductor device including buried oxide layerUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jul 16, 2024·0 cites·9 claims
- 0872US11417685B2Fin transistor structure and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Aug 16, 2022·1 cites·8 claims
- 0971US11342465B2Method of forming oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 2021·Granted May 24, 2022·0 cites·7 claims
- 1069US11869953B2High voltage transistor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jan 9, 2024·0 cites·3 claims
- 1169US11721702B2Fabrication method of fin transistorUNITED MICROELECTRONICS CORP·Filed 2022·Granted Aug 8, 2023·0 cites·10 claims
- 1268US11626515B2High voltage semiconductor device including buried oxide layer and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Apr 11, 2023·0 cites·9 claims
- 1365US9291692B2Blood-brain barrier recovery curve assessment method and systemUNIV NAT YANG MING·Filed 2014·Granted Mar 22, 2016·5 cites·14 claims
- 1464US11476343B2High voltage transistor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2021·Granted Oct 18, 2022·0 cites·8 claims
- 1556US10446688B1Oxide semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Oct 15, 2019·0 cites·8 claims
- 1656US2024347588A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →