Inventor · disambiguated record
Shusuke Kantake
Also filed as: KANTAKE SHUSUKE
5 granted patents·1 pending application·30 citations·filing 2005–2011
75Inventor score
Top patents by PatentIndex Score
6 records- 0182US7549099B2Testing apparatus and testing methodADVANTEST CORP·Filed 2005·Granted Jun 16, 2009·16 cites·16 claims
- 0277US7511547B2Delay circuit, and testing apparatusADVANTEST CORP·Filed 2006·Granted Mar 31, 2009·10 cites·27 claims
- 0360US7460969B2Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor deviceADVANTEST CORP·Filed 2006·Granted Dec 2, 2008·3 cites·12 claims
- 0449US7574316B2Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor deviceADVANTEST CORP·Filed 2008·Granted Aug 11, 2009·1 cites·12 claims
- 0536US8604773B2Receiving apparatus, test apparatus, receiving method, and test methodKANTAKE SHUSUKE·Filed 2010·Granted Dec 10, 2013·0 cites·16 claims
- 0634US2011248733A1Test apparatus and test methodADVANTEST CORP·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →