Inventor · disambiguated record
Shinsuke Kawanishi
Also filed as: KAWANISHI SHINSUKE
22 granted patents·3 pending applications·26 citations·filing 2011–2021
91Inventor score
Top patents by PatentIndex Score
25 records- 0183US8933400B2Inspection or observation apparatus and sample inspection or observation methodOMINAMI YUSUKE·Filed 2012·Granted Jan 13, 2015·5 cites·13 claims
- 0276US9472375B2Charged particle beam device, sample stage unit, and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 18, 2016·3 cites·15 claims
- 0367US9741530B2Charged-particle-beam device, specimen-image acquisition method, and program recording mediumHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 22, 2017·1 cites·20 claims
- 0466US9633817B2Diaphragm mounting member and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 25, 2017·1 cites·16 claims
- 0565US8969828B2Scanning electron microscope with a table being guided by rolling friction elementsSAKAMOTO NAOKI·Filed 2011·Granted Mar 3, 2015·2 cites·6 claims
- 0660US9236217B2Inspection or observation apparatus and sample inspection or observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 12, 2016·0 cites·3 claims
- 0757US10157724B2Electron scanning microscope and image generation methodHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 18, 2018·0 cites·8 claims
- 0853US9824854B2Charged particle beam device, image generation method, observation systemHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 21, 2017·0 cites·18 claims
- 0949US9466457B2Observation apparatus and optical axis adjustment methodHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 11, 2016·0 cites·16 claims
- 1049US9373480B2Charged particle beam device and filter memberHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 21, 2016·0 cites·11 claims
- 1149US9251996B2Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jigHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 2, 2016·0 cites·18 claims
- 1249USD748706SThin membrane holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 2, 2016·6 cites·1 claims
- 1349US9240305B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 19, 2016·0 cites·17 claims
- 1449USD730962SBase of a thin membrane holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 2, 2015·6 cites·1 claims
- 1548US9875877B2Electron scanning microscope and image generation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 23, 2018·0 cites·9 claims
- 1648US9564288B2Sample storage container, charged particle beam apparatus, and image acquiring methodHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 7, 2017·0 cites·14 claims
- 1746US12374520B2Tweezers, conveyance device, and method for conveying sample pieceHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 29, 2025·0 cites·14 claims
- 1846US9741526B2Charged particle beam apparatus and sample image acquiring methodHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 22, 2017·0 cites·6 claims
- 1945US9362083B2Charged particle beam apparatus and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 7, 2016·0 cites·17 claims
- 2045US9263232B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 16, 2016·0 cites·15 claims
- 2145US2024412941A1Lamella Mounting Method, and Analysis SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2244US2015213999A1Charged Particle Beam ApparatusHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 2337US2013056636A1Scanning electron microscopeHANEDA SHIGERU·Filed 2011·Application pending·0 cites
- 2434US10141157B2Method for adjusting height of sample and observation systemHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 27, 2018·0 cites·23 claims
- 2531USD731570SThin membrane holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 9, 2015·2 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →