Inventor · disambiguated record
Shinya Kitayama
Also filed as: KITAYAMA SHINYA
11 granted patents·3 pending applications·19 citations·filing 2011–2021
83Inventor score
Files withHORIZON INT INC4HITACHI HIGH TECH SCIENCE CORP3KITAYAMA SHINYA3ENOMOTO HIROHISA2DENSO CORP1
Top patents by PatentIndex Score
14 records- 0187US9202672B2Apparatus and method for probe shape processing by ion beamKITAYAMA SHINYA·Filed 2011·Granted Dec 1, 2015·12 cites·12 claims
- 0285US10312051B2Composite charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted Jun 4, 2019·3 cites·16 claims
- 0384US10903040B2Composite charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Jan 26, 2021·2 cites·9 claims
- 0472US11462381B2Composite charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Oct 4, 2022·0 cites·2 claims
- 0566US11011062B2Pedestrian detection apparatus and pedestrian detection methodDENSO CORP·Filed 2017·Granted May 18, 2021·2 cites·18 claims
- 0649US2024170250A1Charged Particle Beam Device and Sample Analysis MethodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0748US2021269270A1Cutting machineHORIZON INT INC·Filed 2021·Application pending·0 cites
- 0847US11400745B2Book binding systemHORIZON INT INC·Filed 2020·Granted Aug 2, 2022·0 cites·9 claims
- 0944US9111721B2Ion beam device and machining methodKITAYAMA SHINYA·Filed 2012·Granted Aug 18, 2015·0 cites·10 claims
- 1043US8791413B2Charged particle beam device and sample observation method using a rotating detectorKITAYAMA SHINYA·Filed 2011·Granted Jul 29, 2014·0 cites·9 claims
- 1139US11135867B2Book block conveying deviceHORIZON INT INC·Filed 2019·Granted Oct 5, 2021·0 cites·7 claims
- 1238US10766290B2Bookbinding machineHORIZON INT INC·Filed 2017·Granted Sep 8, 2020·0 cites·2 claims
- 1338US8927930B2Charged particle deviceENOMOTO HIROHISA·Filed 2012·Granted Jan 6, 2015·0 cites·17 claims
- 1430US2013126750A1Charged particle deviceENOMOTO HIROHISA·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →