Inventor · disambiguated record
Shin Koyama
Also filed as: KOYAMA SHIN · KOYAMA SHIN-ICHI
9 granted patents·4 pending applications·33 citations·filing 2001–2023
82Inventor score
Files withNEC ELECTRONICS CORP4CANON KK2DAIO SEISHI KK2RENESAS ELECTRONICS CORP2SANDISK TECHNOLOGIES LLC2
Top patents by PatentIndex Score
13 records- 0169US6603179B2Semiconductor apparatus including CMOS circuits and method for fabricating the sameNEC ELECTRONICS CORP·Filed 2001·Granted Aug 5, 2003·17 cites·17 claims
- 0263US7801410B2Video transfer systemCANON KK·Filed 2005·Granted Sep 21, 2010·2 cites·13 claims
- 0362US6614081B2High-performance MOS transistor of LDD structure having a gate insulating film with a nitride central portion and oxide end portionsNEC ELECTRONICS CORP·Filed 2001·Granted Sep 2, 2003·10 cites·27 claims
- 0457US8343865B2Semiconductor device having dual work function metalRENESAS ELECTRONICS CORP·Filed 2011·Granted Jan 1, 2013·1 cites·5 claims
- 0549US2024121961A1Method of making a three-dimensional memory device using dual water vapor flow oxidation and apparatus for performing the sameSANDISK TECHNOLOGIES LLC·Filed 2023·Application pending·0 cites
- 0646US6794258B2High-performance MOS transistor of LDD structure having a gate insulating film with a nitride central portion and oxide end portionsNEC ELECTRONICS CORP·Filed 2003·Granted Sep 21, 2004·3 cites·8 claims
- 0745US10658469B2Semiconductor device including a plurality of nitride semiconductor layersRENESAS ELECTRONICS CORP·Filed 2014·Granted May 19, 2020·0 cites·10 claims
- 0843US7791639B2Control apparatus, video processing apparatus, and control method thereofCANON KK·Filed 2005·Granted Sep 7, 2010·0 cites·4 claims
- 0942US11334727B2Electronic tag writing system and method for sameDAIO SEISHI KK·Filed 2019·Granted May 17, 2022·0 cites·9 claims
- 1041US11393757B2Three-dimensional memory device containing oxidation-resistant contact structures and methods of making the sameSANDISK TECHNOLOGIES LLC·Filed 2020·Granted Jul 19, 2022·0 cites·8 claims
- 1138US2008038851A1Pattern for evaluating electric characteristics, method for evaluating electric characteristics, method for manufacturing semiconductor device and method for providing reliability assuranceNEC ELECTRONICS CORP·Filed 2007·Application pending·0 cites
- 1230US2001016388A1Method for fabricating semiconductor deviceFiled 2001·Application pending·0 cites
- 1327US2022188530A1Electronic tag writing system and method for sameDAIO SEISHI KK·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →