Inventor · disambiguated record
Shuhong Liu
Also filed as: LIU SHUHONG
5 granted patents·3 pending applications·16 citations·filing 2006–2016
74Inventor score
Top patents by PatentIndex Score
8 records- 0181US9746428B2Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lensINTEL CORP·Filed 2016·Granted Aug 29, 2017·3 cites·20 claims
- 0279US9389064B2Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lensINTEL CORP·Filed 2014·Granted Jul 12, 2016·4 cites·12 claims
- 0377US9508610B2Inline measurement of molding material thickness using terahertz reflectanceINTEL CORP·Filed 2014·Granted Nov 29, 2016·5 cites·15 claims
- 0470US7795145B2Patterning crystalline compounds on surfacesBASF AG·Filed 2006·Granted Sep 14, 2010·4 cites·44 claims
- 0544US2007269924A1Patterning nanowires on surfaces for fabricating nanoscale electronic devicesBASF AG·Filed 2006·Application pending·0 cites
- 0643US2008134961A1Single-crystal organic semiconductor materials and approaches thereforBAO ZHENAN·Filed 2007·Application pending·0 cites
- 0736US9441952B2Metrology tool for electroless copper thickness measurement for BBUL process development monitoringGHOSH NILANJAN·Filed 2013·Granted Sep 13, 2016·0 cites·16 claims
- 0832US2017059303A1Nondestructive optical detection of trace undercut, width and thicknessMAY ROBERT ALAN·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →