Inventor · disambiguated record
Shi-Huei Liu
Also filed as: LIU SHI · LIU SHI-HUEI
14 granted patents·3 pending applications·72 citations·filing 2001–2025
90Inventor score
Top patents by PatentIndex Score
17 records- 0178US8917568B2Method of operating PSRAM and related memory deviceETRON TECHNOLOGY INC·Filed 2013·Granted Dec 23, 2014·7 cites·12 claims
- 0274US7515669B2Dynamic input setup/hold time improvement architectureETRON TECHNOLOGY INC·Filed 2005·Granted Apr 7, 2009·6 cites·23 claims
- 0370US6661719B1Wafer level burn-in for memory integrated circuitETRON TECHNOLOGY INC·Filed 2002·Granted Dec 9, 2003·17 cites·25 claims
- 0467US6643166B1Low power SRAM redundancy repair schemeETRON TECHNOLOGY INC·Filed 2001·Granted Nov 4, 2003·15 cites·13 claims
- 0562US8717841B2Method of controlling a refresh operation of PSRAM and related deviceCHEN HO-YIN·Filed 2012·Granted May 6, 2014·3 cites·7 claims
- 0659US6894917B2DRAM refresh scheme with flexible frequency for active and standby modeETRON TECHNOLOGY INC·Filed 2003·Granted May 17, 2005·10 cites·28 claims
- 0759US2025191641A1Timing control circuit and method for asynchronous time domain to synchronous time domain transfer and related memory module thereofPIECEMAKERS TECH INC·Filed 2024·Application pending·0 cites
- 0858US7478294B2Time controllable sensing scheme for sense amplifier in memory IC testETRON TECHNOLOGY INC·Filed 2005·Granted Jan 13, 2009·4 cites·13 claims
- 0956US8755236B2Latch system applied to a plurality of banks of a memory circuitSHIAH CHUN·Filed 2012·Granted Jun 17, 2014·2 cites·6 claims
- 1055US2025278299A1Processor scheduling method and apparatus, computer device, computer-readable storage medium, and computer program productTENCENT TECH SHENZHEN CO LTD·Filed 2025·Application pending·0 cites
- 1152US6366123B1Input buffer circuit for low power applicationETRON TECHNOLOGY INC·Filed 2001·Granted Apr 2, 2002·6 cites·6 claims
- 1249US8331178B2Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory deviceLIU SHI-HUEI·Filed 2011·Granted Dec 11, 2012·2 cites·18 claims
- 1345US10312345B2Transistor having a gate with a variable work function and method for manufacturing the sameINST OF MICROELECTRONICS CAS·Filed 2018·Granted Jun 4, 2019·0 cites·10 claims
- 1432US8223566B2Memory device and memory control methodSHIAH CHUN·Filed 2010·Granted Jul 17, 2012·0 cites·21 claims
- 1531US8543877B2Method of performing a chip burn-in scanning with increased efficiencyCHEN WEI-JU·Filed 2011·Granted Sep 24, 2013·0 cites·11 claims
- 1631US2012167019A1Mask revision recording circuit for a memory circuitLIU SHI-HUEI·Filed 2011·Application pending·0 cites
- 1730US8713386B2Device for increasing chip testing efficiency and method thereofLIU SHI-HUEI·Filed 2012·Granted Apr 29, 2014·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →