Inventor · disambiguated record
Shawn Mcvey
Also filed as: MCVEY SHAWN
8 granted patents·2 pending applications·35 citations·filing 2006–2025
83Inventor score
Top patents by PatentIndex Score
10 records- 0193US7521693B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Apr 21, 2009·23 cites·107 claims
- 0286US9218935B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 22, 2015·5 cites·20 claims
- 0383US9218934B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 22, 2015·5 cites·18 claims
- 0482US9640364B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted May 2, 2017·2 cites·18 claims
- 0561US9536699B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Jan 3, 2017·0 cites·20 claims
- 0661US2025266240A1Editing of deep, multi-layered structuresZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0758US9627172B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Apr 18, 2017·0 cites·21 claims
- 0856US11378532B2Inspection system and inspection method to qualify semiconductor structuresZEISS CARL SMT GMBH·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
- 0942US9000396B2Charged particle detectorsHILL RAYMOND·Filed 2011·Granted Apr 7, 2015·0 cites·32 claims
- 1039US2013118184A1Cooled charged particle systems and methodsGROHOLSKI ALEXANDER·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →