Inventor · disambiguated record
Shigeru Miwa
Also filed as: MIWA SHIGERU
5 granted patents·1 pending application·42 citations·filing 1998–2004
79Inventor score
Files withHITACHI CONSTRUCTION MACHINERY2HITACHI KENKI FINE TECH CO LTD2HITACHI KENKI FINETECH CO LTD1MURAYAMA KEN1
Top patents by PatentIndex Score
6 records- 0157US7333191B2Scanning probe microscope and measurement method using the sameHITACHI KENKI FINETECH CO LTD·Filed 2004·Granted Feb 19, 2008·11 cites·10 claims
- 0246US7388199B2Probe manufacturing method, probe, and scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jun 17, 2008·5 cites·17 claims
- 0345US6397681B1Portable ultrasonic detectorHITACHI CONSTRUCTION MACHINERY·Filed 1999·Granted Jun 4, 2002·14 cites·15 claims
- 0443US7350404B2Scanning type probe microscope and probe moving control method thereforHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Apr 1, 2008·3 cites·4 claims
- 0538US6112593APortable non-destructive inspection device and support casing thereforHITACHI CONSTRUCTION MACHINERY·Filed 1998·Granted Sep 5, 2000·9 cites·6 claims
- 0633US2007180889A1Probe replacement method for scanning probe microscopeMURAYAMA KEN·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →