Inventor · disambiguated record
Shigeki Nishina
Also filed as: NISHINA SHIGEKI
16 granted patents·2 pending applications·97 citations·filing 1994–2018
91Inventor score
Top patents by PatentIndex Score
18 records- 0182US8493057B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumNISHINA SHIGEKI·Filed 2010·Granted Jul 23, 2013·5 cites·10 claims
- 0282US8183528B2Electromagnetic wave measuring apparatus, measurement method, a program, and a recording mediumKATO EIJI·Filed 2009·Granted May 22, 2012·8 cites·10 claims
- 0379US10919105B2Three-dimensional laminating and shaping apparatus and laminating and shaping methodADVANTEST CORP·Filed 2018·Granted Feb 16, 2021·1 cites·14 claims
- 0471US5657121ASpectrum measuring device eliminating polarization dependencyADVANTEST CORP·Filed 1995·Granted Aug 12, 1997·39 cites·7 claims
- 0569US8210035B2Collection medium and collection amount measuring apparatus, and measuring method, program, and recording medium of the sameIMAMURA MOTOKI·Filed 2009·Granted Jul 3, 2012·5 cites·24 claims
- 0669US6411382B1Monochromator and spectrometric methodADVANTEST CORP·Filed 2000·Granted Jun 25, 2002·14 cites·9 claims
- 0765US8481938B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumNISHINA SHIGEKI·Filed 2010·Granted Jul 9, 2013·1 cites·12 claims
- 0863US8330110B2Container, container positioning method, and measuring methodNISHINA SHIGEKI·Filed 2009·Granted Dec 11, 2012·2 cites·55 claims
- 0960US8378703B2Container, a method for disposing the same, and a measurement methodADVANTEST CORP·Filed 2009·Granted Feb 19, 2013·2 cites·11 claims
- 1059US2011097649A1Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the sameADVANTEST CORP·Filed 2009·Application pending·0 cites
- 1157US9176008B2Electromagnetic wave measuring apparatus, measuring method, program, and recording mediumADVANTEST CORP·Filed 2013·Granted Nov 3, 2015·0 cites·11 claims
- 1254US8053733B2Electromagnetic wave measuring apparatusADVANTEST CORP·Filed 2009·Granted Nov 8, 2011·0 cites·14 claims
- 1353US11229971B2Three-dimensional laminating and shaping apparatus and laminating and shaping methodADVANTEST CORP·Filed 2018·Granted Jan 25, 2022·0 cites·9 claims
- 1453US8969807B2Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the sameIMAMURA MOTOKI·Filed 2012·Granted Mar 3, 2015·0 cites·18 claims
- 1546US5969809ALight-measuring device for accurate and continuous measurement of light intensityADVANTEST CORP·Filed 1998·Granted Oct 19, 1999·15 cites·17 claims
- 1642US7760344B2Optical sampling apparatusADVANTEST CORP·Filed 2008·Granted Jul 20, 2010·0 cites·11 claims
- 1740US2010321682A1Holding fixture, placement method of holding fixture, and measurement methodADVANTEST CORP·Filed 2010·Application pending·0 cites
- 1830US5867271AMichelson interferometer including a non-polarizing beam splitterADVANTEST CORP·Filed 1994·Granted Feb 2, 1999·5 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →