Inventor · disambiguated record
Shigehisa Nozawa
Also filed as: NOZAWA SHIGEHISA
5 granted patents·1 pending application·4 citations·filing 2007–2012
68Inventor score
Technology areasG01N
Top patents by PatentIndex Score
6 records- 0173US7589833B2Foreign matter inspection apparatus and foreign matter inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 15, 2009·4 cites·18 claims
- 0258US7847928B2Inspection device and inspection methodHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 7, 2010·0 cites·16 claims
- 0357US7876431B2Foreign matter inspection apparatus and foreign matter inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 25, 2011·0 cites·7 claims
- 0456US2013033705A1Inspection device and inspection methodHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 0554US8314930B2Inspection device and inspection methodTANIGUCHI KOICHI·Filed 2010·Granted Nov 20, 2012·0 cites·11 claims
- 0648US8625089B2Foreign matter inspection apparatus and foreign matter inspection methodBAMBA YOSHIO·Filed 2010·Granted Jan 7, 2014·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →