Inventor · disambiguated record
Shinsuke Sadamitsu
Also filed as: SADAMITSU SHINSUKE
11 granted patents·3 pending applications·157 citations·filing 1997–2011
90Inventor score
Top patents by PatentIndex Score
14 records- 0189US7700394B2Method for manufacturing silicon wafer methodSUMCO CORP·Filed 2005·Granted Apr 20, 2010·20 cites·8 claims
- 0285US6641888B2Silicon single crystal, silicon wafer, and epitaxial wafer.SUMITOMO MITSUBISHI SILICON·Filed 2002·Granted Nov 4, 2003·29 cites·12 claims
- 0379US7397110B2High resistance silicon wafer and its manufacturing methodSUMITOMO MITSUBISHI SILICON·Filed 2003·Granted Jul 8, 2008·24 cites·15 claims
- 0474US7316745B2High-resistance silicon wafer and process for producing the sameSUMCO CORP·Filed 2003·Granted Jan 8, 2008·21 cites·15 claims
- 0574US6129787ASemiconductor silicon wafer, semiconductor silicon wafer fabrication method and annealing equipmentSUMITOMO METAL IND·Filed 1998·Granted Oct 10, 2000·45 cites·24 claims
- 0651US7226571B2High resistivity silicon wafer and method for fabricating the sameSUMITOMO MITSUBISHI SILICON·Filed 2004·Granted Jun 5, 2007·3 cites·18 claims
- 0751US7220308B2Manufacturing method of high resistivity silicon single crystalSUMITOMO MITSUBISHI SILICON·Filed 2004·Granted May 22, 2007·2 cites·8 claims
- 0846US2011171814A1Silicon epitaxial wafer and production method for sameSUMCO CORP·Filed 2011·Application pending·0 cites
- 0944US7803228B2Process for producing high-resistance silicon wafers and process for producing epitaxial wafers and SOI wafersSUMCO CORP·Filed 2004·Granted Sep 28, 2010·1 cites·8 claims
- 1042US6277193B1Method for manufacturing semiconductor silicon epitaxial wafer and semiconductor deviceSUMITOMO METAL IND·Filed 1997·Granted Aug 21, 2001·12 cites·8 claims
- 1141US2002142170A1Silicon single crystal, silicon wafer, and epitaxial waferSUMITOMO METAL IND·Filed 2002·Application pending·0 cites
- 1240US2009017291A1Silicon epitaxial wafer and production method for sameSADAMITSU SHINSUKE·Filed 2005·Application pending·0 cites
- 1337US6803242B2Evaluation method of IG effectivity in semiconductor silicon substratesSUMITOMO MITSUBISHI SILICON·Filed 2003·Granted Oct 12, 2004·0 cites·2 claims
- 1435US8252404B2High resistivity silicon wafersSADAMITSU SHINSUKE·Filed 2004·Granted Aug 28, 2012·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →