Inventor · disambiguated record
Sharmin Sadoughi
Also filed as: SADOUGHI SHARMIN
12 granted patents·130 citations·filing 1997–2011
91Inventor score
Top patents by PatentIndex Score
12 records- 0187US6774452B1Semiconductor structure having alignment marks with shallow trench isolationCYPRESS SEMICONDUCTOR CORP·Filed 2002·Granted Aug 10, 2004·42 cites·5 claims
- 0285US7629653B1Techniques for improving negative bias temperature instability (NBTI) lifetime of field effect transistorsCYPRESS SEMICONDUCTOR CORP·Filed 2007·Granted Dec 8, 2009·10 cites·5 claims
- 0380US8653844B2Calibrating device performance within an integrated circuitSADOUGHI SHARMIN·Filed 2011·Granted Feb 18, 2014·5 cites·18 claims
- 0471US8302064B1Method of product performance improvement by selective feature sizing of semiconductor devicesSADOUGHI SHARMIN·Filed 2009·Granted Oct 30, 2012·6 cites·16 claims
- 0568US8035166B2Integrated circuit device with stress reduction layerXILINX INC·Filed 2009·Granted Oct 11, 2011·2 cites·13 claims
- 0666US6713831B1Borderless contact architectureCYPRESS SEMICONDUCTOR CORP·Filed 2001·Granted Mar 30, 2004·12 cites·19 claims
- 0764US6841491B1In situ deposition of a nitride layer and of an anti-reflective layerCYPRESS SEMICONDUCTOR CORP·Filed 2001·Granted Jan 11, 2005·9 cites·35 claims
- 0863US8183105B2Integrated circuit device with stress reduction layerSADOUGHI SHARMIN·Filed 2011·Granted May 22, 2012·1 cites·20 claims
- 0962US7192839B1Semiconductor structure having alignment marks with shallow trench isolationCYPRESS SEMICONDUCTOR CORP·Filed 2004·Granted Mar 20, 2007·9 cites·16 claims
- 1059US7256087B1Techniques for improving negative bias temperature instability (NBTI) lifetime of field effect transistorsCYPRESS SEMICONDUCTOR CORP·Filed 2004·Granted Aug 14, 2007·7 cites·11 claims
- 1157US6033991AIsolation scheme based on recessed locos using a sloped Si etch and dry field oxidationCYPRESS SEMICONDUCTOR CORP·Filed 1997·Granted Mar 7, 2000·21 cites·20 claims
- 1233US6399462B1Method and structure for isolating integrated circuit components and/or semiconductor active devicesCYPRESS SEMICONDUCTOR CORP·Filed 1997·Granted Jun 4, 2002·6 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →